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Field, Ryan M., Lary, Jenifer, Cohn, John, Paninski, Liam, Shepard, Kenneth L. (2010) A low-noise, single-photon avalanche diode in standard 0.13 μm complementary metal-oxide-semiconductor process. Applied Physics Letters, 97 (21). 211111pp. doi:10.1063/1.3518473

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Reference TypeJournal (article/letter/editorial)
TitleA low-noise, single-photon avalanche diode in standard 0.13 μm complementary metal-oxide-semiconductor process
JournalApplied Physics Letters
AuthorsField, Ryan M.Author
Lary, JeniferAuthor
Cohn, JohnAuthor
Paninski, LiamAuthor
Shepard, Kenneth L.Author
Year2010 (November 22)Volume97
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.3518473Search in ResearchGate
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Mindat Ref. ID8588460Long-form Identifiermindat:1:5:8588460:7
GUID0
Full ReferenceField, Ryan M., Lary, Jenifer, Cohn, John, Paninski, Liam, Shepard, Kenneth L. (2010) A low-noise, single-photon avalanche diode in standard 0.13 μm complementary metal-oxide-semiconductor process. Applied Physics Letters, 97 (21). 211111pp. doi:10.1063/1.3518473
Plain TextField, Ryan M., Lary, Jenifer, Cohn, John, Paninski, Liam, Shepard, Kenneth L. (2010) A low-noise, single-photon avalanche diode in standard 0.13 μm complementary metal-oxide-semiconductor process. Applied Physics Letters, 97 (21). 211111pp. doi:10.1063/1.3518473
In(2010, November) Applied Physics Letters Vol. 97 (21) AIP Publishing

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Kang, Hyo-Soon, Lee, Myung-Jae, Choi, Woo-Young (2007) Si avalanche photodetectors fabricated in standard complementary metal-oxide-semiconductor process. Applied Physics Letters, 90 (15). 151118pp. doi:10.1063/1.2722028
Wang, Wei, Bao, Xiaoyuan, Chen, Li, Chen, Ting, Wang, Guanyu, Yuan, Jun (2017) High photon detection efficiency single photon avalanche diode in 0.18 μm standard CMOS process. Modern Physics Letters B, 31. 1750193pp. doi:10.1142/s0217984917501937
Paranjape, M., Ristic, Lj. (1992) Micromachined vertical hall magnetic field sensor in standard complementary metal oxide semiconductor technology. Applied Physics Letters, 60 (25). 3188-3190 doi:10.1063/1.106738
Wayne, Michael A., Bienfang, Joshua C., Migdall, Alan L. (2021) Low-noise photon counting above 100 × 106 counts per second with a high-efficiency reach-through single-photon avalanche diode system. Applied Physics Letters, 118 (13) 134002pp. doi:10.1063/5.0041984
Kloster-Landsberg, M., Tyndall, D., Wang, I., Walker, R., Richardson, J., Henderson, R., Delon, A. (2013) Note: Multi-confocal fluorescence correlation spectroscopy in living cells using a complementary metal oxide semiconductor-single photon avalanche diode array. Review of Scientific Instruments, 84 (7). 76105pp. doi:10.1063/1.4816156
Acosta, Antonio G., Rodriguez, John A., Nishida, Toshikazu (2014) Mechanical stress effects on Pb(Zr,Ti)O3 thin-film ferroelectric capacitors embedded in a standard complementary metal-oxide-semiconductor process. Applied Physics Letters, 104 (22). 222908pp. doi:10.1063/1.4881596
Zou, Huan, Geng, Yongtao, Wang, Pingshan (2011) Transmission line based short pulse generation circuits in a 0.13 μm complementary metal–oxide–semiconductor technology. Review of Scientific Instruments, 82 (2). 23301pp. doi:10.1063/1.3534834
Muñoz-Gamarra, J. L., Uranga, A., Barniol, N. (2014) Nanomechanical switches based on metal-insulator-metal capacitors from a standard complementary-metal-oxide semiconductor technology. Applied Physics Letters, 104 (24). 243105pp. doi:10.1063/1.4882918
Dai, J. Y., Guo, Z. R., Tee, S. F., Tay, C. L., Er, Eddie, Redkar, S. (2001) Formation of cobalt silicide spikes in 0.18 μm complementary metal oxide semiconductor process. Applied Physics Letters, 78 (20). 3091-3093 doi:10.1063/1.1372621
Ferrus, T., George, R., Barnes, C. H. W., Pepper, M. (2010) Disorder and electron interaction control in low-doped silicon metal-oxide-semiconductor field effect transistors. Applied Physics Letters, 97 (14). 142108pp. doi:10.1063/1.3499360
Warburton, Ryan E., Itzler, Mark, Buller, Gerald S. (2009) Free-running, room temperature operation of an InGaAs/InP single-photon avalanche diode. Applied Physics Letters, 94 (7). 71116pp. doi:10.1063/1.3079668
 
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