Cheng, Ching-Jung, Kan, Daisuke, Anbusathaiah, Varatharajan, Takeuchi, Ichiro, Nagarajan, Valanoor (2010) Microstructure-electromechanical property correlations in rare-earth-substituted BiFeO3 epitaxial thin films at morphotropic phase boundaries. Applied Physics Letters, 97 (21). 212905pp. doi:10.1063/1.3520642
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Microstructure-electromechanical property correlations in rare-earth-substituted BiFeO3 epitaxial thin films at morphotropic phase boundaries | ||
Journal | Applied Physics Letters | ||
Authors | Cheng, Ching-Jung | Author | |
Kan, Daisuke | Author | ||
Anbusathaiah, Varatharajan | Author | ||
Takeuchi, Ichiro | Author | ||
Nagarajan, Valanoor | Author | ||
Year | 2010 (November 22) | Volume | 97 |
Issue | 21 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3520642Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8588509 | Long-form Identifier | mindat:1:5:8588509:5 |
GUID | 0 | ||
Full Reference | Cheng, Ching-Jung, Kan, Daisuke, Anbusathaiah, Varatharajan, Takeuchi, Ichiro, Nagarajan, Valanoor (2010) Microstructure-electromechanical property correlations in rare-earth-substituted BiFeO3 epitaxial thin films at morphotropic phase boundaries. Applied Physics Letters, 97 (21). 212905pp. doi:10.1063/1.3520642 | ||
Plain Text | Cheng, Ching-Jung, Kan, Daisuke, Anbusathaiah, Varatharajan, Takeuchi, Ichiro, Nagarajan, Valanoor (2010) Microstructure-electromechanical property correlations in rare-earth-substituted BiFeO3 epitaxial thin films at morphotropic phase boundaries. Applied Physics Letters, 97 (21). 212905pp. doi:10.1063/1.3520642 | ||
In | (2010, November) Applied Physics Letters Vol. 97 (21) AIP Publishing |
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