Cazaux, Jacques (2011) Calculated dependence of few-layer graphene on secondary electron emissions from SiC. Applied Physics Letters, 98 (1). 13109pp. doi:10.1063/1.3534805
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Calculated dependence of few-layer graphene on secondary electron emissions from SiC | ||
Journal | Applied Physics Letters | ||
Authors | Cazaux, Jacques | Author | |
Year | 2011 (January 3) | Volume | 98 |
Issue | 1 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3534805Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8590944 | Long-form Identifier | mindat:1:5:8590944:7 |
GUID | 0 | ||
Full Reference | Cazaux, Jacques (2011) Calculated dependence of few-layer graphene on secondary electron emissions from SiC. Applied Physics Letters, 98 (1). 13109pp. doi:10.1063/1.3534805 | ||
Plain Text | Cazaux, Jacques (2011) Calculated dependence of few-layer graphene on secondary electron emissions from SiC. Applied Physics Letters, 98 (1). 13109pp. doi:10.1063/1.3534805 | ||
In | (2011, January) Applied Physics Letters Vol. 98 (1) AIP Publishing |
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