Sullivan, J. T., Wilks, R. G., Winkler, M. T., Weinhardt, L., Recht, D., Said, A. J., Newman, B. K., Zhang, Y., Blum, M., Krause, S., Yang, W. L., Heske, C., Aziz, M. J., Bär, M., Buonassisi, T. (2011) Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur. Applied Physics Letters, 99 (14). 142102pp. doi:10.1063/1.3643050
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur | ||
Journal | Applied Physics Letters | ||
Authors | Sullivan, J. T. | Author | |
Wilks, R. G. | Author | ||
Winkler, M. T. | Author | ||
Weinhardt, L. | Author | ||
Recht, D. | Author | ||
Said, A. J. | Author | ||
Newman, B. K. | Author | ||
Zhang, Y. | Author | ||
Blum, M. | Author | ||
Krause, S. | Author | ||
Yang, W. L. | Author | ||
Heske, C. | Author | ||
Aziz, M. J. | Author | ||
Bär, M. | Author | ||
Buonassisi, T. | Author | ||
Year | 2011 (October 3) | Volume | 99 |
Issue | 14 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3643050Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8596297 | Long-form Identifier | mindat:1:5:8596297:8 |
GUID | 0 | ||
Full Reference | Sullivan, J. T., Wilks, R. G., Winkler, M. T., Weinhardt, L., Recht, D., Said, A. J., Newman, B. K., Zhang, Y., Blum, M., Krause, S., Yang, W. L., Heske, C., Aziz, M. J., Bär, M., Buonassisi, T. (2011) Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur. Applied Physics Letters, 99 (14). 142102pp. doi:10.1063/1.3643050 | ||
Plain Text | Sullivan, J. T., Wilks, R. G., Winkler, M. T., Weinhardt, L., Recht, D., Said, A. J., Newman, B. K., Zhang, Y., Blum, M., Krause, S., Yang, W. L., Heske, C., Aziz, M. J., Bär, M., Buonassisi, T. (2011) Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur. Applied Physics Letters, 99 (14). 142102pp. doi:10.1063/1.3643050 | ||
In | (2011, October) Applied Physics Letters Vol. 99 (14) AIP Publishing |
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