Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Heo, Sung, Tahir, Dahlang, Chung, Jae Gwan, Lee, Jae Cheol, Kim, KiHong, Lee, Junho, Lee, Hyung-Ik, Park, Gyeong Su, Oh, Suhk Kun, Kang, Hee Jae, Choi, Pyungho, Choi, Byoung-Deog (2015) Band alignment of atomic layer deposited (HfZrO4)1βˆ’x(SiO2)x gate dielectrics on Si (100). Applied Physics Letters, 107 (18). 182101pp. doi:10.1063/1.4934567

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleBand alignment of atomic layer deposited (HfZrO4)1βˆ’x(SiO2)x gate dielectrics on Si (100)
JournalApplied Physics Letters
AuthorsHeo, SungAuthor
Tahir, DahlangAuthor
Chung, Jae GwanAuthor
Lee, Jae CheolAuthor
Kim, KiHongAuthor
Lee, JunhoAuthor
Lee, Hyung-IkAuthor
Park, Gyeong SuAuthor
Oh, Suhk KunAuthor
Kang, Hee JaeAuthor
Choi, PyunghoAuthor
Choi, Byoung-DeogAuthor
Year2015 (November 2)Volume107
Issue18
PublisherAIP Publishing
DOIdoi:10.1063/1.4934567Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8636706Long-form Identifiermindat:1:5:8636706:4
GUID0
Full ReferenceHeo, Sung, Tahir, Dahlang, Chung, Jae Gwan, Lee, Jae Cheol, Kim, KiHong, Lee, Junho, Lee, Hyung-Ik, Park, Gyeong Su, Oh, Suhk Kun, Kang, Hee Jae, Choi, Pyungho, Choi, Byoung-Deog (2015) Band alignment of atomic layer deposited (HfZrO4)1βˆ’x(SiO2)x gate dielectrics on Si (100). Applied Physics Letters, 107 (18). 182101pp. doi:10.1063/1.4934567
Plain TextHeo, Sung, Tahir, Dahlang, Chung, Jae Gwan, Lee, Jae Cheol, Kim, KiHong, Lee, Junho, Lee, Hyung-Ik, Park, Gyeong Su, Oh, Suhk Kun, Kang, Hee Jae, Choi, Pyungho, Choi, Byoung-Deog (2015) Band alignment of atomic layer deposited (HfZrO4)1βˆ’x(SiO2)x gate dielectrics on Si (100). Applied Physics Letters, 107 (18). 182101pp. doi:10.1063/1.4934567
In(2015, November) Applied Physics Letters Vol. 107 (18) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Tahir, Dahlang, Lee, Eun Kyoung, Oh, Suhk Kun, Tham, Tran Thi, Kang, Hee Jae, Jin, Hua, Heo, Sung, Park, Ju Chul, Chung, Jae Gwan, Lee, Jae Cheol (2009) Band alignment of atomic layer deposited (ZrO2)x(SiO2)1βˆ’x gate dielectrics on Si (100). Applied Physics Letters, 94 (21). 212902pp. doi:10.1063/1.3143223
Heo, Sung, Chung, JaeGwan, Lee, Jae Cheol, Song, Taewon, Kim, Seong Heon, Yun, Dong-Jin, Lee, Hyung Ik, Kim, KiHong, Park, Gyeong Su, Oh, Jong Soo, Kwak, Dong Wook, Lee, DongWha, Cho, Hoon Young, Tahi, Dahlang, Kang, Hee Jae, Choi, Byoung-Deog (2016) Band alignment and defect states in amorphous GaInZnO thin films grown on SiO2/Si substrates. Surface and Interface Analysis, 48 (10). 1062-1065 doi:10.1002/sia.6024
Tahir, Dahlang, Lee, Eun Kyoung, Oh, Suhk Kun, Kang, Hee Jae, Heo, Sung, Chung, Jae Gwan, Lee, Jae Cheol, Tougaard, Sven (2009) Dielectric and optical properties of Zr silicate thin films grown on Si(100) by atomic layer deposition. Journal of Applied Physics, 106 (8). 84108pp. doi:10.1063/1.3246612
Heo, Sung, Chung, JaeGwan, Lee, Hyung-Ik, Lee, Junho, Park, Jong-Bong, Cho, Eunae, Kim, KiHong, Kim, Seong Heon, Park, Gyeong Su, Lee, Dongho, Lee, Jaehan, Nam, Junggyu, Yang, JungYup, Lee, Dongwha, Cho, Hoon Young, Kang, Hee Jae, Choi, Pyung-Ho, Choi, Byoung-Deog (2016) Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement. Scientific Reports, 6. doi:10.1038/srep30554
Tahir, Dahlang, Choi, Eun Hye, Cho, Young Joon, Oh, Suhk Kun, Kang, Hee Jae, Jin, Hua, Heo, Sung, Chung, Jae Gwan, Lee, Jae Cheol, Tougaard, Sven (2010) Electronic and optical properties of La-aluminate dielectric thin films on Si (100). Surface and Interface Analysis, 42 (10). 1566-1569 doi:10.1002/sia.3590
Tahir, Dahlang, Lee, Eun Kyoung, Kwon, Hyuk Lan, Kun Oh, Suhk, Kang, Hee Jae, Heo, Sung, Lee, Eun Ha, Chung, Jae Gwan, Lee, Jae Cheol, Tougaard, Sven (2010) Electronic and optical properties of GIZO thin film grown on SiO2/Si substrates. Surface and Interface Analysis, 42 (6). 906-910 doi:10.1002/sia.3364
Jin, Hua, Cho, Young Joon, Oh, Suhk Kun, Kang, Hee Jae, Park, Ju Chul, Heo, Sung, Lee, Jae Cheol (2008) Band gap engineering for La aluminate dielectrics on Si (100). Applied Physics Letters, 93 (5). 52904pp. doi:10.1063/1.2964181
Heo, Sung, Lee, Hyung-Ik, Song, Taewon, Park, Jong-Bong, Ko, Dong-Su, Chung, JaeGwan, Kim, KiHong, Kim, Seong Heon, Yun, Dong-Jin, Ham, YongNam, Park, Gyeong Su, Lee, Dongho, Nam, Junggyu, Kang, Hee Jae, Choi, Pyung-Ho, Choi, Byoung-Deog (2015) Direct band gap measurement of Cu(In,Ga)(Se,S)2 thin films using high-resolution reflection electron energy loss spectroscopy. Applied Physics Letters, 106 (26). 261601pp. doi:10.1063/1.4923201
Tahir, Dahlang, Kwon, Hyuk Lan, Shin, Hye Chung, Oh, Suhk Kun, Kang, Hee Jae, Heo, Sung, Chung, Jae Gwan, Lee, Jae Cheol, Tougaard, Sven (2010) Electronic and optical properties of Al2O3/SiO2thin films grown on Si substrate. Journal of Physics D: Applied Physics, 43. 255301pp. doi:10.1088/0022-3727/43/25/255301
Shin, Hye Chung, Tahir, Dahlang, Seo, Soonjoo, Denny, Yus Rama, Oh, Suhk Kun, Kang, Hee Jae, Heo, Sung, Chung, Jae Gwan, Lee, Jae Cheol, Tougaard, Sven (2012) Reflection electron energy loss spectroscopy for ultrathin gate oxide materials. Surface and Interface Analysis, 44 (6). 623-627 doi:10.1002/sia.3861
Kyoung, Yong Koo, Chung, Jae Gwan, Lee, Hyung Ik, Yun, Dong-Jin, Lee, Jae Cheol, Kim, Yong Su, Oh, Suhk Kun, Kang, Hee Jae (2014) Electronic structures of SiO2thin films via Ar gas cluster ion beam sputtering. Surface and Interface Analysis, 46. 58-61 doi:10.1002/sia.5460
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Β© OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 30, 2025 08:18:47
Go to top of page