Yuan, Chao, Pomeroy, James W., Kuball, Martin (2018) Above bandgap thermoreflectance for non-invasive thermal characterization of GaN-based wafers. Applied Physics Letters, 113 (10). 102101pp. doi:10.1063/1.5040100
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Above bandgap thermoreflectance for non-invasive thermal characterization of GaN-based wafers | ||
| Journal | Applied Physics Letters | ||
| Authors | Yuan, Chao | Author | |
| Pomeroy, James W. | Author | ||
| Kuball, Martin | Author | ||
| Year | 2018 (September 3) | Volume | 113 |
| Issue | 10 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.5040100Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8653584 | Long-form Identifier | mindat:1:5:8653584:1 |
| GUID | 0 | ||
| Full Reference | Yuan, Chao, Pomeroy, James W., Kuball, Martin (2018) Above bandgap thermoreflectance for non-invasive thermal characterization of GaN-based wafers. Applied Physics Letters, 113 (10). 102101pp. doi:10.1063/1.5040100 | ||
| Plain Text | Yuan, Chao, Pomeroy, James W., Kuball, Martin (2018) Above bandgap thermoreflectance for non-invasive thermal characterization of GaN-based wafers. Applied Physics Letters, 113 (10). 102101pp. doi:10.1063/1.5040100 | ||
| In | (2018, September) Applied Physics Letters Vol. 113 (10) AIP Publishing | ||
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