Lorenz, Michael, Hohenberger, Stefan, Rose, Eduard, Grundmann, Marius (2018) Atomically stepped, pseudomorphic, corundum-phase (Al1-xGax)2O3 thin films (0 ≤ x < 0.08) grown on R-plane sapphire. Applied Physics Letters, 113 (23). 231902pp. doi:10.1063/1.5059374
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Atomically stepped, pseudomorphic, corundum-phase (Al1-xGax)2O3 thin films (0 ≤ x < 0.08) grown on R-plane sapphire | ||
Journal | Applied Physics Letters | ||
Authors | Lorenz, Michael | Author | |
Hohenberger, Stefan | Author | ||
Rose, Eduard | Author | ||
Grundmann, Marius | Author | ||
Year | 2018 (December 3) | Volume | 113 |
Issue | 23 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.5059374Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8654828 | Long-form Identifier | mindat:1:5:8654828:9 |
GUID | 0 | ||
Full Reference | Lorenz, Michael, Hohenberger, Stefan, Rose, Eduard, Grundmann, Marius (2018) Atomically stepped, pseudomorphic, corundum-phase (Al1-xGax)2O3 thin films (0 ≤ x < 0.08) grown on R-plane sapphire. Applied Physics Letters, 113 (23). 231902pp. doi:10.1063/1.5059374 | ||
Plain Text | Lorenz, Michael, Hohenberger, Stefan, Rose, Eduard, Grundmann, Marius (2018) Atomically stepped, pseudomorphic, corundum-phase (Al1-xGax)2O3 thin films (0 ≤ x | ||
In | (2018, December) Applied Physics Letters Vol. 113 (23) AIP Publishing |
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