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Iino, Kiyoshi, Umesaki, Norimasa (2004) Advanced materials analysis using synchrotron radiation and its application in engineering science. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/014

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Reference TypeJournal (article/letter/editorial)
TitleAdvanced materials analysis using synchrotron radiation and its application in engineering science
JournalJournal of Physics: Condensed Matter
AuthorsIino, KiyoshiAuthor
Umesaki, NorimasaAuthor
Year2004 (August 25)Volume16
Issue33
PublisherIOP Publishing
DOIdoi:10.1088/0953-8984/16/33/014Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8697816Long-form Identifiermindat:1:5:8697816:1
GUID0
Full ReferenceIino, Kiyoshi, Umesaki, Norimasa (2004) Advanced materials analysis using synchrotron radiation and its application in engineering science. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/014
Plain TextIino, Kiyoshi, Umesaki, Norimasa (2004) Advanced materials analysis using synchrotron radiation and its application in engineering science. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/014
In(2004, August) Journal of Physics: Condensed Matter Vol. 16 (33) IOP Publishing

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Moser, Herbert O (2004) Synchrotron Radiation for Advanced Materials Analysis and Processing. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/e01
Virojanadara, C, Johansson, L I (2004) Studies of NO on 4H-SiC(0001) using synchrotron radiation. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/003
Johansson, L I, Virojanadara, C (2004) Synchrotron radiation studies of the SiO2/SiC(0001) interface. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/002
Tejeda, Antonio, Michel, Enrique G (2004) The photoelectron diffraction technique applied to advanced materials. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/004
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Burkel, Eberhard (2004) Special issue on new materials and their dynamics - advances through synchrotron radiation: Euroschool 2002. Journal of Physics: Condensed Matter, 16 (5). doi:10.1088/0953-8984/16/5/e01
Kim, Jae Y, Hanson, Jonathan C, Frenkel, Anatoly I, Lee, Peter L, Rodriguez, José A (2004) Reaction of CuO with hydrogen studied by using synchrotron-based x-ray diffraction. Journal of Physics: Condensed Matter, 16 (33). doi:10.1088/0953-8984/16/33/008
Virojanadara, C, Johansson, L I (2004) Studies of oxidized hexagonal SiC surfaces and the SiC/SiO2interface using photoemission and synchrotron radiation. Journal of Physics: Condensed Matter, 16 (17). doi:10.1088/0953-8984/16/17/017
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