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Hristu, R., Stanciu, S. G., Wu, S. J., Kao, F.-J., Kwon, O’D., Stanciu, G. A. (2011) Optical beam induced current microscopy of photonic quantum ring lasers. Applied Physics B, 103 (3). 653-657 doi:10.1007/s00340-011-4441-3

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Reference TypeJournal (article/letter/editorial)
TitleOptical beam induced current microscopy of photonic quantum ring lasers
JournalApplied Physics B
AuthorsHristu, R.Author
Stanciu, S. G.Author
Wu, S. J.Author
Kao, F.-J.Author
Kwon, O’D.Author
Stanciu, G. A.Author
Year2011 (June)Volume103
Issue3
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00340-011-4441-3Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9021645Long-form Identifiermindat:1:5:9021645:7
GUID0
Full ReferenceHristu, R., Stanciu, S. G., Wu, S. J., Kao, F.-J., Kwon, O’D., Stanciu, G. A. (2011) Optical beam induced current microscopy of photonic quantum ring lasers. Applied Physics B, 103 (3). 653-657 doi:10.1007/s00340-011-4441-3
Plain TextHristu, R., Stanciu, S. G., Wu, S. J., Kao, F.-J., Kwon, O’D., Stanciu, G. A. (2011) Optical beam induced current microscopy of photonic quantum ring lasers. Applied Physics B, 103 (3). 653-657 doi:10.1007/s00340-011-4441-3
In(2011, June) Applied Physics B Vol. 103 (3) Springer Science and Business Media LLC

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Hristu, R., Stanciu, S. G., Kao, F.-J., Stanciu, G. A. (2012) Two-photon excited photoluminescence of photonic quantum ring laser structures. Applied Physics B, 107 (1). 97-101 doi:10.1007/s00340-011-4813-8
Tranca, D. E., Stanciu, S. G., Hristu, R., Stoichita, C., Tofail, S. A. M., Stanciu, G. A. (2015) High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy. Scientific Reports, 5. doi:10.1038/srep11876
Stanciu, Stefan G., Hristu, Radu, Stanciu, George A. (2011) Digital image inpainting and microscopy imaging. Microscopy Research and Technique, 74 (11). 1049-1057 doi:10.1002/jemt.20993
Tranca, Denis E., Stanciu, Stefan G., Hristu, Radu, Latterini, Loredana, Stanciu, George A. (2020) Surface optical characterization at nanoscale using phasor representation of data acquired by scattering scanning near-field optical microscopy. Applied Surface Science, 509. 145347pp. doi:10.1016/j.apsusc.2020.145347
Dutta, N, Mohanta, D, Ahmed, G A, Choudhury, A, Hristu, R, Stanciu, S G, Stanciu, G A (2010) Two Photon Emission and Nonlinear Optical Imaging of Acetonitrile-Treated Quasi-Spherical Nanoscale PbS Systems. IEEE Photonics Journal, 2 (6) 1060-1068 doi:10.1109/jphot.2010.2093513
Chen, L., Wang, G. P., Li, X., Li, W., Shen, Y., Lai, J., Chen, S. (2011) Broadband slow-light in graded-grating-loaded plasmonic waveguides at telecom frequencies. Applied Physics B, 104 (3). 653-657 doi:10.1007/s00340-011-4476-5
Hristu, Radu, Stanciu, Stefan G., Tranca, Denis E., Stanciu, George A. (2015) Electron beam influence on the carbon contamination of electron irradiated hydroxyapatite thin films. Applied Surface Science, 346. 342-347 doi:10.1016/j.apsusc.2015.03.214
Stanciu, Stefan G., Hristu, Radu, Stanciu, George A. (2011) Influence of Confocal Scanning Laser Microscopy specific acquisition parameters on the detection and matching of Speeded-Up Robust Features. Ultramicroscopy, 111 (5). 364-374 doi:10.1016/j.ultramic.2011.01.014
Hristu, Radu, Stanciu, Stefan G., Tranca, Denis E., Matei, Alecs, Stanciu, George A. (2015) Nonlinear optical imaging of defects in cubic silicon carbide epilayers. Scientific Reports, 4. doi:10.1038/srep05258
Esposito, E., Kao, Fu-Jen, McConnell, G. (2007) Confocal optical beam induced current microscopy of light-emitting diodes with a white-light supercontinuum source. Applied Physics B, 88 (4). 551-555 doi:10.1007/s00340-007-2758-8
Stanciu, Stefan G., Hristu, Radu, Boriga, Radu, Stanciu, George A. (2010) On the Suitability of SIFT Technique to Deal with Image Modifications Specific to Confocal Scanning Laser Microscopy. Microscopy and Microanalysis, 16 (5). 515-530 doi:10.1017/s1431927610000371
 
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