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Fourmaux, S., Kieffer, J. C. (2016) Laser-based K α X-ray emission characterization using a high contrast ratio and high-power laser system. Applied Physics B, 122 (6). doi:10.1007/s00340-016-6442-8

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Reference TypeJournal (article/letter/editorial)
TitleLaser-based K α X-ray emission characterization using a high contrast ratio and high-power laser system
JournalApplied Physics B
AuthorsFourmaux, S.Author
Kieffer, J. C.Author
Year2016 (June)Volume122
Issue6
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00340-016-6442-8Search in ResearchGate
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Mindat Ref. ID9023788Long-form Identifiermindat:1:5:9023788:5
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Full ReferenceFourmaux, S., Kieffer, J. C. (2016) Laser-based K α X-ray emission characterization using a high contrast ratio and high-power laser system. Applied Physics B, 122 (6). doi:10.1007/s00340-016-6442-8
Plain TextFourmaux, S., Kieffer, J. C. (2016) Laser-based K α X-ray emission characterization using a high contrast ratio and high-power laser system. Applied Physics B, 122 (6). doi:10.1007/s00340-016-6442-8
In(2016, June) Applied Physics B Vol. 122 (6) Springer Science and Business Media LLC

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Fourmaux, S., Serbanescu, C., Kincaid, R. E., Krol, A., Kieffer, J. C. (2009) K α x-ray emission characterization of 100 Hz, 15 mJ femtosecond laser system with high contrast ratio. Applied Physics B, 94 (4). 569-575 doi:10.1007/s00340-008-3342-6
Fourmaux, S., Hallin, E., Arnison, P. G., Kieffer, J. C. (2019) Optimization of laser-based synchrotron X-ray for plant imaging. Applied Physics B, 125 (3). doi:10.1007/s00340-019-7144-9
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