Carrière, Simon D., Chalikakis, Konstantinos, Danquigny, Charles, Torres-Rondon, Laura (2017) Using resistivity or logarithm of resistivity to calculate depth of investigation index to assess reliability of electrical resistivity tomography. Geophysics, 82 (5) doi:10.1190/geo2016-0244.1
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Using resistivity or logarithm of resistivity to calculate depth of investigation index to assess reliability of electrical resistivity tomography | ||
| Journal | Geophysics | ||
| Authors | Carrière, Simon D. | Author | |
| Chalikakis, Konstantinos | Author | ||
| Danquigny, Charles | Author | ||
| Torres-Rondon, Laura | Author | ||
| Year | 2017 (September) | Volume | 82 |
| Issue | 5 | ||
| Publisher | Society of Exploration Geophysicists | ||
| DOI | doi:10.1190/geo2016-0244.1Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 911201 | Long-form Identifier | mindat:1:5:911201:2 |
| GUID | 0 | ||
| Full Reference | Carrière, Simon D., Chalikakis, Konstantinos, Danquigny, Charles, Torres-Rondon, Laura (2017) Using resistivity or logarithm of resistivity to calculate depth of investigation index to assess reliability of electrical resistivity tomography. Geophysics, 82 (5) doi:10.1190/geo2016-0244.1 | ||
| Plain Text | Carrière, Simon D., Chalikakis, Konstantinos, Danquigny, Charles, Torres-Rondon, Laura (2017) Using resistivity or logarithm of resistivity to calculate depth of investigation index to assess reliability of electrical resistivity tomography. Geophysics, 82 (5) doi:10.1190/geo2016-0244.1 | ||
| In | (2017, September) Geophysics Vol. 82 (5) Society of Exploration Geophysicists | ||
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