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Swaminathan, Muthukaruppan, Yadav, Pankaj Kumar, Piloto, Obdulio, Sjöblom, Tobias, Cheong, Ian (2017) A new distance measure for non-identical data with application to image classification. Pattern Recognition, 63. 384-396 doi:10.1016/j.patcog.2016.10.018

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Reference TypeJournal (article/letter/editorial)
TitleA new distance measure for non-identical data with application to image classification
JournalPattern Recognition
AuthorsSwaminathan, MuthukaruppanAuthor
Yadav, Pankaj KumarAuthor
Piloto, ObdulioAuthor
Sjöblom, TobiasAuthor
Cheong, IanAuthor
Year2017 (March)Volume63
PublisherElsevier BV
DOIdoi:10.1016/j.patcog.2016.10.018Search in ResearchGate
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Mindat Ref. ID9366818Long-form Identifiermindat:1:5:9366818:3
GUID0
Full ReferenceSwaminathan, Muthukaruppan, Yadav, Pankaj Kumar, Piloto, Obdulio, Sjöblom, Tobias, Cheong, Ian (2017) A new distance measure for non-identical data with application to image classification. Pattern Recognition, 63. 384-396 doi:10.1016/j.patcog.2016.10.018
Plain TextSwaminathan, Muthukaruppan, Yadav, Pankaj Kumar, Piloto, Obdulio, Sjöblom, Tobias, Cheong, Ian (2017) A new distance measure for non-identical data with application to image classification. Pattern Recognition, 63. 384-396 doi:10.1016/j.patcog.2016.10.018
In(2017) Pattern Recognition Vol. 63. Elsevier BV

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