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Sun, Yao, Ren, Lejian, Wei, Zhen, Liu, Bin, Zhai, Yanlong, Liu, Si (2017) A weakly supervised method for makeup-invariant face verification. Pattern Recognition, 66. 153-159 doi:10.1016/j.patcog.2017.01.011

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Reference TypeJournal (article/letter/editorial)
TitleA weakly supervised method for makeup-invariant face verification
JournalPattern Recognition
AuthorsSun, YaoAuthor
Ren, LejianAuthor
Wei, ZhenAuthor
Liu, BinAuthor
Zhai, YanlongAuthor
Liu, SiAuthor
Year2017 (June)Volume66
PublisherElsevier BV
DOIdoi:10.1016/j.patcog.2017.01.011Search in ResearchGate
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Mindat Ref. ID9366919Long-form Identifiermindat:1:5:9366919:1
GUID0
Full ReferenceSun, Yao, Ren, Lejian, Wei, Zhen, Liu, Bin, Zhai, Yanlong, Liu, Si (2017) A weakly supervised method for makeup-invariant face verification. Pattern Recognition, 66. 153-159 doi:10.1016/j.patcog.2017.01.011
Plain TextSun, Yao, Ren, Lejian, Wei, Zhen, Liu, Bin, Zhai, Yanlong, Liu, Si (2017) A weakly supervised method for makeup-invariant face verification. Pattern Recognition, 66. 153-159 doi:10.1016/j.patcog.2017.01.011
In(2017) Pattern Recognition Vol. 66. Elsevier BV

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