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Lee, Jaesung, Kim, Dae-Won (2017) SCLS: Multi-label feature selection based on scalable criterion for large label set. Pattern Recognition, 66. 342-352 doi:10.1016/j.patcog.2017.01.014

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Reference TypeJournal (article/letter/editorial)
TitleSCLS: Multi-label feature selection based on scalable criterion for large label set
JournalPattern Recognition
AuthorsLee, JaesungAuthor
Kim, Dae-WonAuthor
Year2017 (June)Volume66
PublisherElsevier BV
DOIdoi:10.1016/j.patcog.2017.01.014Search in ResearchGate
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Mindat Ref. ID9366922Long-form Identifiermindat:1:5:9366922:5
GUID0
Full ReferenceLee, Jaesung, Kim, Dae-Won (2017) SCLS: Multi-label feature selection based on scalable criterion for large label set. Pattern Recognition, 66. 342-352 doi:10.1016/j.patcog.2017.01.014
Plain TextLee, Jaesung, Kim, Dae-Won (2017) SCLS: Multi-label feature selection based on scalable criterion for large label set. Pattern Recognition, 66. 342-352 doi:10.1016/j.patcog.2017.01.014
In(2017) Pattern Recognition Vol. 66. Elsevier BV

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