Baker-Jarvis, James (2008) Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations. Entropy, 10 (4). 411-429 doi:10.3390/e10040411
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations | ||
Journal | Entropy | ||
Authors | Baker-Jarvis, James | Author | |
Year | 2008 (October 8) | Volume | 10 |
Issue | 4 | ||
Publisher | MDPI AG | ||
DOI | doi:10.3390/e10040411Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9423035 | Long-form Identifier | mindat:1:5:9423035:8 |
GUID | 0 | ||
Full Reference | Baker-Jarvis, James (2008) Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations. Entropy, 10 (4). 411-429 doi:10.3390/e10040411 | ||
Plain Text | Baker-Jarvis, James (2008) Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations. Entropy, 10 (4). 411-429 doi:10.3390/e10040411 | ||
In | (2008, October) Entropy Vol. 10 (4) MDPI AG |
See Also
These are possibly similar items as determined by title/reference text matching only.
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() |