Geipel, T., Banhart, F. (1996) Temperature-dependence of the Frank-Read source in Si. Computational Materials Science, 7 (1). 181-186 doi:10.1016/s0927-0256(96)00078-x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Temperature-dependence of the Frank-Read source in Si | ||
Journal | Computational Materials Science | ||
Authors | Geipel, T. | Author | |
Banhart, F. | Author | ||
Year | 1996 (December) | Volume | 7 |
Issue | 1 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0927-0256(96)00078-xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9502638 | Long-form Identifier | mindat:1:5:9502638:1 |
GUID | 0 | ||
Full Reference | Geipel, T., Banhart, F. (1996) Temperature-dependence of the Frank-Read source in Si. Computational Materials Science, 7 (1). 181-186 doi:10.1016/s0927-0256(96)00078-x | ||
Plain Text | Geipel, T., Banhart, F. (1996) Temperature-dependence of the Frank-Read source in Si. Computational Materials Science, 7 (1). 181-186 doi:10.1016/s0927-0256(96)00078-x | ||
In | (1996, December) Computational Materials Science Vol. 7 (1) Elsevier BV |
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