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Wang, Changquan (2020) Effect of N2 Jet on Si Electrode Surface in Dielectric Barrier Discharge. IOP Conference Series: Earth and Environmental Science, 440. 22059pp. doi:10.1088/1755-1315/440/2/022059

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Reference TypeJournal (article/letter/editorial)
TitleEffect of N2 Jet on Si Electrode Surface in Dielectric Barrier Discharge
JournalIOP Conference Series: Earth and Environmental Science
AuthorsWang, ChangquanAuthor
Year2020 (March 19)Volume440
PublisherIOP Publishing
DOIdoi:10.1088/1755-1315/440/2/022059Search in ResearchGate
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Mindat Ref. ID9601864Long-form Identifiermindat:1:5:9601864:4
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Full ReferenceWang, Changquan (2020) Effect of N2 Jet on Si Electrode Surface in Dielectric Barrier Discharge. IOP Conference Series: Earth and Environmental Science, 440. 22059pp. doi:10.1088/1755-1315/440/2/022059
Plain TextWang, Changquan (2020) Effect of N2 Jet on Si Electrode Surface in Dielectric Barrier Discharge. IOP Conference Series: Earth and Environmental Science, 440. 22059pp. doi:10.1088/1755-1315/440/2/022059
In(2020) IOP Conference Series: Earth and Environmental Science Vol. 440. IOP Publishing

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