Reference Type | Journal (article/letter/editorial) |
---|
Title | Nanocharacterization of titanium nitride thin films obtained by reactive magnetron sputtering |
---|
Journal | IOP Conference Series: Materials Science and Engineering |
---|
Authors | Merie, V V | Author |
---|
Pustan, M S | Author |
Bîrleanu, C | Author |
Negrea, G | Author |
Year | 2014 (August 22) | Volume | 64 |
---|
Publisher | IOP Publishing |
---|
DOI | doi:10.1088/1757-899x/64/1/012025Search in ResearchGate |
---|
| Generate Citation Formats |
Mindat Ref. ID | 9777610 | Long-form Identifier | mindat:1:5:9777610:7 |
---|
|
GUID | 0 |
---|
Full Reference | Merie, V V, Pustan, M S, Bîrleanu, C, Negrea, G (2014) Nanocharacterization of titanium nitride thin films obtained by reactive magnetron sputtering. IOP Conference Series: Materials Science and Engineering, 64. 12025pp. doi:10.1088/1757-899x/64/1/012025 |
---|
Plain Text | Merie, V V, Pustan, M S, Bîrleanu, C, Negrea, G (2014) Nanocharacterization of titanium nitride thin films obtained by reactive magnetron sputtering. IOP Conference Series: Materials Science and Engineering, 64. 12025pp. doi:10.1088/1757-899x/64/1/012025 |
---|
In | (n.d.) IOP Conference Series: Materials Science and Engineering Vol. 64. IOP Publishing |
---|
These are possibly similar items as determined by title/reference text matching only.