Ismail, L N, Wahid, M H, Habibah, Z, Herman, S H, Rozana, M D, Rusop, M (2014) Electrical Characterization of Metal-Ferroelectric-Insulator- Semiconductor having Double Layered Insulator for Memory Applications. IOP Conference Series: Materials Science and Engineering, 64. 12053pp. doi:10.1088/1757-899x/64/1/012053
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Electrical Characterization of Metal-Ferroelectric-Insulator- Semiconductor having Double Layered Insulator for Memory Applications | ||
| Journal | IOP Conference Series: Materials Science and Engineering | ||
| Authors | Ismail, L N | Author | |
| Wahid, M H | Author | ||
| Habibah, Z | Author | ||
| Herman, S H | Author | ||
| Rozana, M D | Author | ||
| Rusop, M | Author | ||
| Year | 2014 (August 22) | Volume | 64 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1757-899x/64/1/012053Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9777638 | Long-form Identifier | mindat:1:5:9777638:3 |
| GUID | 0 | ||
| Full Reference | Ismail, L N, Wahid, M H, Habibah, Z, Herman, S H, Rozana, M D, Rusop, M (2014) Electrical Characterization of Metal-Ferroelectric-Insulator- Semiconductor having Double Layered Insulator for Memory Applications. IOP Conference Series: Materials Science and Engineering, 64. 12053pp. doi:10.1088/1757-899x/64/1/012053 | ||
| Plain Text | Ismail, L N, Wahid, M H, Habibah, Z, Herman, S H, Rozana, M D, Rusop, M (2014) Electrical Characterization of Metal-Ferroelectric-Insulator- Semiconductor having Double Layered Insulator for Memory Applications. IOP Conference Series: Materials Science and Engineering, 64. 12053pp. doi:10.1088/1757-899x/64/1/012053 | ||
| In | (n.d.) IOP Conference Series: Materials Science and Engineering Vol. 64. IOP Publishing | ||
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