Surmeneva, M, Tyurin, A, Mukhametkaliyev, T, Teresov, A, Koval, A, Pirozhkova, T, Shuvarin, I, Chudinova, E, Surmenev, R (2015) The effect of Si content on structure and mechanical features of silicon-containing calcium-phosphate-based films deposited by RF-magnetron sputtering on titanium substrate treated by pulsed electron beam. IOP Conference Series: Materials Science and Engineering, 98. 12028pp. doi:10.1088/1757-899x/98/1/012028
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | The effect of Si content on structure and mechanical features of silicon-containing calcium-phosphate-based films deposited by RF-magnetron sputtering on titanium substrate treated by pulsed electron beam | ||
| Journal | IOP Conference Series: Materials Science and Engineering | ||
| Authors | Surmeneva, M | Author | |
| Tyurin, A | Author | ||
| Mukhametkaliyev, T | Author | ||
| Teresov, A | Author | ||
| Koval, A | Author | ||
| Pirozhkova, T | Author | ||
| Shuvarin, I | Author | ||
| Chudinova, E | Author | ||
| Surmenev, R | Author | ||
| Year | 2015 (November 6) | Volume | 98 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1757-899x/98/1/012028Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9779719 | Long-form Identifier | mindat:1:5:9779719:1 |
| GUID | 0 | ||
| Full Reference | Surmeneva, M, Tyurin, A, Mukhametkaliyev, T, Teresov, A, Koval, A, Pirozhkova, T, Shuvarin, I, Chudinova, E, Surmenev, R (2015) The effect of Si content on structure and mechanical features of silicon-containing calcium-phosphate-based films deposited by RF-magnetron sputtering on titanium substrate treated by pulsed electron beam. IOP Conference Series: Materials Science and Engineering, 98. 12028pp. doi:10.1088/1757-899x/98/1/012028 | ||
| Plain Text | Surmeneva, M, Tyurin, A, Mukhametkaliyev, T, Teresov, A, Koval, A, Pirozhkova, T, Shuvarin, I, Chudinova, E, Surmenev, R (2015) The effect of Si content on structure and mechanical features of silicon-containing calcium-phosphate-based films deposited by RF-magnetron sputtering on titanium substrate treated by pulsed electron beam. IOP Conference Series: Materials Science and Engineering, 98. 12028pp. doi:10.1088/1757-899x/98/1/012028 | ||
| In | (n.d.) IOP Conference Series: Materials Science and Engineering Vol. 98. IOP Publishing | ||
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