Chen, Q L, Ouyang, M, Liu, Q C, Jin, H Y, Xie, W G (2015) Revealing the effect of electrode materials on the performance of low-voltage pentacene thin film transistor by in-situ surface potential measurement. IOP Conference Series: Materials Science and Engineering, 103. 12011pp. doi:10.1088/1757-899x/103/1/012011
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Revealing the effect of electrode materials on the performance of low-voltage pentacene thin film transistor by in-situ surface potential measurement | ||
| Journal | IOP Conference Series: Materials Science and Engineering | ||
| Authors | Chen, Q L | Author | |
| Ouyang, M | Author | ||
| Liu, Q C | Author | ||
| Jin, H Y | Author | ||
| Xie, W G | Author | ||
| Year | 2015 (December 9) | Volume | 103 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1757-899x/103/1/012011Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9780102 | Long-form Identifier | mindat:1:5:9780102:3 |
| GUID | 0 | ||
| Full Reference | Chen, Q L, Ouyang, M, Liu, Q C, Jin, H Y, Xie, W G (2015) Revealing the effect of electrode materials on the performance of low-voltage pentacene thin film transistor by in-situ surface potential measurement. IOP Conference Series: Materials Science and Engineering, 103. 12011pp. doi:10.1088/1757-899x/103/1/012011 | ||
| Plain Text | Chen, Q L, Ouyang, M, Liu, Q C, Jin, H Y, Xie, W G (2015) Revealing the effect of electrode materials on the performance of low-voltage pentacene thin film transistor by in-situ surface potential measurement. IOP Conference Series: Materials Science and Engineering, 103. 12011pp. doi:10.1088/1757-899x/103/1/012011 | ||
| In | (n.d.) IOP Conference Series: Materials Science and Engineering Vol. 103. IOP Publishing | ||
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