Reference Type | Journal (article/letter/editorial) |
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Title | 3D X-rays application for precision measurement of the cell structure of extruded polystyrene |
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Journal | IOP Conference Series: Materials Science and Engineering |
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Authors | Lim, J Y | Author |
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Kim, K Y | Author |
Shin, H S | Author |
Yeom, S | Author |
Lee, S E | Author |
Year | 2015 (December 9) | Volume | 103 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/1757-899x/103/1/012019Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9780110 | Long-form Identifier | mindat:1:5:9780110:2 |
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GUID | 0 |
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Full Reference | Lim, J Y, Kim, K Y, Shin, H S, Yeom, S, Lee, S E (2015) 3D X-rays application for precision measurement of the cell structure of extruded polystyrene. IOP Conference Series: Materials Science and Engineering, 103. 12019pp. doi:10.1088/1757-899x/103/1/012019 |
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Plain Text | Lim, J Y, Kim, K Y, Shin, H S, Yeom, S, Lee, S E (2015) 3D X-rays application for precision measurement of the cell structure of extruded polystyrene. IOP Conference Series: Materials Science and Engineering, 103. 12019pp. doi:10.1088/1757-899x/103/1/012019 |
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In | (n.d.) IOP Conference Series: Materials Science and Engineering Vol. 103. IOP Publishing |
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