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Gołuński, Ł., Zwolski, K., Płotka, P. (2016) Electrical Characterization of Diamond/Boron Doped Diamond Nanostructures for Use in Harsh Environment Applications. IOP Conference Series: Materials Science and Engineering, 104. 12022pp. doi:10.1088/1757-899x/104/1/012022

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Reference TypeJournal (article/letter/editorial)
TitleElectrical Characterization of Diamond/Boron Doped Diamond Nanostructures for Use in Harsh Environment Applications
JournalIOP Conference Series: Materials Science and Engineering
AuthorsGołuński, Ł.Author
Zwolski, K.Author
Płotka, P.Author
Year2016 (January 21)Volume104
PublisherIOP Publishing
DOIdoi:10.1088/1757-899x/104/1/012022Search in ResearchGate
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Mindat Ref. ID9780168Long-form Identifiermindat:1:5:9780168:9
GUID0
Full ReferenceGołuński, Ł., Zwolski, K., Płotka, P. (2016) Electrical Characterization of Diamond/Boron Doped Diamond Nanostructures for Use in Harsh Environment Applications. IOP Conference Series: Materials Science and Engineering, 104. 12022pp. doi:10.1088/1757-899x/104/1/012022
Plain TextGołuński, Ł., Zwolski, K., Płotka, P. (2016) Electrical Characterization of Diamond/Boron Doped Diamond Nanostructures for Use in Harsh Environment Applications. IOP Conference Series: Materials Science and Engineering, 104. 12022pp. doi:10.1088/1757-899x/104/1/012022
In(n.d.) IOP Conference Series: Materials Science and Engineering Vol. 104. IOP Publishing

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