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Fournelle, J, Cathey, H, Pinard, P T, Richter, S (2016) Low voltage EPMA: experiments on a new frontier in microanalysis - analytical lateral resolution. IOP Conference Series: Materials Science and Engineering, 109. 12003pp. doi:10.1088/1757-899x/109/1/012003

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Reference TypeJournal (article/letter/editorial)
TitleLow voltage EPMA: experiments on a new frontier in microanalysis - analytical lateral resolution
JournalIOP Conference Series: Materials Science and Engineering
AuthorsFournelle, JAuthor
Cathey, HAuthor
Pinard, P TAuthor
Richter, SAuthor
Year2016 (February 9)Volume109
PublisherIOP Publishing
DOIdoi:10.1088/1757-899x/109/1/012003Search in ResearchGate
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Mindat Ref. ID9780407Long-form Identifiermindat:1:5:9780407:5
GUID0
Full ReferenceFournelle, J, Cathey, H, Pinard, P T, Richter, S (2016) Low voltage EPMA: experiments on a new frontier in microanalysis - analytical lateral resolution. IOP Conference Series: Materials Science and Engineering, 109. 12003pp. doi:10.1088/1757-899x/109/1/012003
Plain TextFournelle, J, Cathey, H, Pinard, P T, Richter, S (2016) Low voltage EPMA: experiments on a new frontier in microanalysis - analytical lateral resolution. IOP Conference Series: Materials Science and Engineering, 109. 12003pp. doi:10.1088/1757-899x/109/1/012003
In(n.d.) IOP Conference Series: Materials Science and Engineering Vol. 109. IOP Publishing

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Pinard, P T, Richter, S (2016) Quantification of low concentration elements using soft X-rays at high spatial resolution. IOP Conference Series: Materials Science and Engineering, 109. 12013pp. doi:10.1088/1757-899x/109/1/012013
Heikinheimo, E., Pinard, P.T., Richter, S., Llovet, X., Louhenkilpi, S. (2016) Electron probe microanalysis of Ni-silicides at low voltage: difficulties and possibilities. IOP Conference Series: Materials Science and Engineering, 109. 12005pp. doi:10.1088/1757-899x/109/1/012005
Richter, S, Pinard, P T (2016) Combined EPMA, FIB and Monte Carlo simulation: a versatile tool for quantitative analysis of multilayered structures. IOP Conference Series: Materials Science and Engineering, 109. 12014pp. doi:10.1088/1757-899x/109/1/012014
Berger, D, Nissen, J (2016) Measurements of the quantitative lateral analytical resolution at sputtered gold-layers with the FEG-EPMA JEOL JXA-8530F. IOP Conference Series: Materials Science and Engineering, 109. 12001pp. doi:10.1088/1757-899x/109/1/012001
Wuhrer, R, Moran, K (2016) Low voltage imaging and X-ray microanalysis in the SEM: challenges and opportunities. IOP Conference Series: Materials Science and Engineering, 109. 12019pp. doi:10.1088/1757-899x/109/1/012019
Pinard, P T, Richter, S (2014) Improving the quantification at high spatial resolution using a field emission electron microprobe. IOP Conference Series: Materials Science and Engineering, 55. 12016pp. doi:10.1088/1757-899x/55/1/012016
Llovet, X, Heikinheimo, E, Galindo, A Núñez, Merlet, C, Bello, J F Almagro, Richter, S, Fournelle, J, van Hoek, C J G (2012) An inter-laboratory comparison of EPMA analysis of alloy steel at low voltage. IOP Conference Series: Materials Science and Engineering, 32. 12014pp. doi:10.1088/1757-899x/32/1/012014
Moy, A, Fournelle, J H (2025) BadgerFilm: A new thin film analysis programme (with other useful applications for EPMA). IOP Conference Series: Materials Science and Engineering, 1324 (1). doi:10.1088/1757-899x/1324/1/012010
Llovet, X, Salvat, F (2016) PENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA. IOP Conference Series: Materials Science and Engineering, 109. 12009pp. doi:10.1088/1757-899x/109/1/012009
Ahmad, F, Yahaya, A S, Safari, A (2016) Development of Low Cost Soil Stabilization Using Recycled Material. IOP Conference Series: Materials Science and Engineering, 136. 12003pp. doi:10.1088/1757-899x/136/1/012003
(2016) Peer review statement. IOP Conference Series: Materials Science and Engineering, 109. 11002 doi:10.1088/1757-899x/109/1/011002
 
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