Kono, S., Enta, Y., Abukawa, T., Kinoshita, T., Sakamoto, T. (1990) Photoelectron spectroscopy and photoelectron diffraction studies of Si(001)2×1-K and -Cs surfaces. Applied Surface Science, 41. 75-81 doi:10.1016/0169-4332(89)90036-6

Library Home Bookshelves View by Type Using Search

Books Catalogs/Sales Lists Journals Reports Thesis/Dissertation

Search for Books Search for Journals Manage Subjects Statistics Books without DDC/LCC Top Unstructured Orphaned Articles

Bookshelves (DDC layout)Bookshelves (LCC layout)Latest Books

Advanced

Search inside 'Applied Surface ...' only

- Only viewable:

Reference Type	Journal (article/letter/editorial)
Title	Photoelectron spectroscopy and photoelectron diffraction studies of Si(001)2×1-K and -Cs surfaces
Journal	Applied Surface Science
Authors	Kono, S.		Author
	Enta, Y.		Author
	Abukawa, T.		Author
	Kinoshita, T.		Author
	Sakamoto, T.		Author
Year	1990 (January)	Volume	41
Publisher	Elsevier BV
DOI	doi:10.1016/0169-4332(89)90036-6Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	9894906	Long-form Identifier	mindat:1:5:9894906:5
GUID	0
Full Reference	Kono, S., Enta, Y., Abukawa, T., Kinoshita, T., Sakamoto, T. (1990) Photoelectron spectroscopy and photoelectron diffraction studies of Si(001)2×1-K and -Cs surfaces. Applied Surface Science, 41. 75-81 doi:10.1016/0169-4332(89)90036-6
Plain Text	Kono, S., Enta, Y., Abukawa, T., Kinoshita, T., Sakamoto, T. (1990) Photoelectron spectroscopy and photoelectron diffraction studies of Si(001)2×1-K and -Cs surfaces. Applied Surface Science, 41. 75-81 doi:10.1016/0169-4332(89)90036-6
In	(n.d.) Applied Surface Science Vol. 41. Elsevier BV

	*Abukawa, T., Kono, S. (1989) Photoelectron diffraction and low energy electron diffraction studies of Cs, K/Si(001) surfaces. Surface Science Letters, 214 (1). doi:10.1016/0167-2584(89)90043-1*
	*Abukawa, T., Kono, S. (1989) Photoelectron diffraction and low energy electron diffraction studies of Cs, K/Si(001) surfaces. Surface Science, 214 (1). 141-148 doi:10.1016/0039-6028(89)90413-5*
	Enta, Y., Kinoshita, T., Suzuki, S., Kono, S. (1989) Angle-resolved ultraviolet photoelectron spectroscopic study of Si(001)-(2×1)/K and Si(001)-(2×1)/Cs surfaces. Physical Review B, 39 (2) 1125-1133 doi:10.1103/physrevb.39.1125
	Abukawa, T., Okane, T., Kono, S. (1991) Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage. Surface Science Letters, 256 (3). doi:10.1016/0167-2584(91)91192-y
	*Enta, Y., Kinoshita, T., Suzuki, S., Kono, S. (1987) Angle-resolved photoelectron-spectroscopy study of the Si(001)2×1-K surface. Physical Review B, 36 (18) 9801-9804 doi:10.1103/physrevb.36.9801*
	Shimomura, M., Ikejima, Y., Yajima, K., Yagi, T., Goto, T., Gunnella, R., Abukawa, T., Fukuda, Y., Kono, S. (2004) Adsorption of thiophene on a Si(0 0 1)-2 × 1 surface studied by photoelectron spectroscopy and diffraction. Applied Surface Science, 237. 75-79 doi:10.1016/j.apsusc.2004.06.084
	Kinoshita, T., Enta, Y., Ohta, H., Yaegashi, Y., Suzuki, S., Kono, S. (1988) Photoelectron and inverse photoelectron spectroscopy studies of the surface. Surface Science, 204 (3). 405-414 doi:10.1016/0039-6028(88)90222-1
	Shivaprasad, S.M., Abukawa, T., Yeom, H.W., Nakamura, M., Suzuki, S., Sato, S., Sakamoto, K., Sakamoto, T., Kono, S. (1995) Ag adsorption on a single domain Si(001)2 × 1 surface studied by electron and photoelectron diffraction. Surface Science, 344 (3). doi:10.1016/0039-6028(95)01002-5
	Abukawa, T., Okane, T., Kono, S. (1991) Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage. Surface Science, 256 (3). 370-378 doi:10.1016/0039-6028(91)90879-w
	Abukawa, T., Kashiwakura, T., Okane, T., Sasaki, Y., Takahashi, H., Enta, Y., Suzuki, S., Kono, S., Sato, S., Kinoshita, T., Kakizaki, A., Ishii, T., Park, C.Y., Yu, S.W., Sakamoto, K., Sakamoto, T. (1992) Angle-resolved photoemission study of a single-domain Si(001)2 × 1-K surface with synchrotron radiation: symmetry and dispersion of surface-states. Surface Science, 261 (1). 217-223 doi:10.1016/0039-6028(92)90233-v
	SHIMOMURA, M., NAKAMURA, T., KIM, K.-S., ABUKAWA, T., TANI, J., KONO, S. (1999) STRUCTURE OF Si(001)-(4×3)-In SURFACE STUDIED BY X-RAY PHOTOELECTRON DIFFRACTION. Surface Review and Letters, 6 (6). 1097-1102 doi:10.1142/s0218625x99001219

Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 13, 2025 12:38:59

Go to top of page

Kono, S., Enta, Y., Abukawa, T., Kinoshita, T., Sakamoto, T. (1990) Photoelectron spectroscopy and photoelectron diffraction studies of Si(001)2×1-K and -Cs surfaces. Applied Surface Science, 41. 75-81 doi:10.1016/0169-4332(89)90036-6

See Also