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Sporken, R., Thiry, P.A., Xhonneux, P., Caudano, R., Delrue, J.P. (1990) Spectroscopic study of metal/semimetal and metal/semiconductor interfaces. Applied Surface Science, 41. 201-206 doi:10.1016/0169-4332(89)90057-3

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Reference TypeJournal (article/letter/editorial)
TitleSpectroscopic study of metal/semimetal and metal/semiconductor interfaces
JournalApplied Surface Science
AuthorsSporken, R.Author
Thiry, P.A.Author
Xhonneux, P.Author
Caudano, R.Author
Delrue, J.P.Author
Year1990 (January)Volume41
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(89)90057-3Search in ResearchGate
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Mindat Ref. ID9894927Long-form Identifiermindat:1:5:9894927:8
GUID0
Full ReferenceSporken, R., Thiry, P.A., Xhonneux, P., Caudano, R., Delrue, J.P. (1990) Spectroscopic study of metal/semimetal and metal/semiconductor interfaces. Applied Surface Science, 41. 201-206 doi:10.1016/0169-4332(89)90057-3
Plain TextSporken, R., Thiry, P.A., Xhonneux, P., Caudano, R., Delrue, J.P. (1990) Spectroscopic study of metal/semimetal and metal/semiconductor interfaces. Applied Surface Science, 41. 201-206 doi:10.1016/0169-4332(89)90057-3
In(n.d.) Applied Surface Science Vol. 41. Elsevier BV


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