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Tung, R.T., Schrey, F. (1990) Epitaxial CoSi2/Si(111) interfaces. Applied Surface Science, 41. 223-229 doi:10.1016/0169-4332(89)90061-5

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Reference TypeJournal (article/letter/editorial)
TitleEpitaxial CoSi2/Si(111) interfaces
JournalApplied Surface Science
AuthorsTung, R.T.Author
Schrey, F.Author
Year1990 (January)Volume41
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(89)90061-5Search in ResearchGate
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Mindat Ref. ID9894931Long-form Identifiermindat:1:5:9894931:1
GUID0
Full ReferenceTung, R.T., Schrey, F. (1990) Epitaxial CoSi2/Si(111) interfaces. Applied Surface Science, 41. 223-229 doi:10.1016/0169-4332(89)90061-5
Plain TextTung, R.T., Schrey, F. (1990) Epitaxial CoSi2/Si(111) interfaces. Applied Surface Science, 41. 223-229 doi:10.1016/0169-4332(89)90061-5
In(n.d.) Applied Surface Science Vol. 41. Elsevier BV

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Werner, J.H., Von Känel, H., Markewitz, G., Tung, R.T. (1990) Pressure dependences of silicide/silicon Schottky barrier heights. Applied Surface Science, 41. 159-163 doi:10.1016/0169-4332(89)90049-4
Fujitani, Hideaki, Asano, Setsuro (1990) Electronic structure of Si/disilicide interfaces. Applied Surface Science, 41. 164-168 doi:10.1016/0169-4332(89)90050-0
Falta, J., Horn, M., Henzler, M. (1990) SPA-LEED studies of defects in thin epitaxial NiSi2 layers on Si(111). Applied Surface Science, 41. 230-235 doi:10.1016/0169-4332(89)90062-7
Bulle-Lieuwma, C.W.T. (1993) Epitaxial growth of CoSi2/Si structures. Applied Surface Science, 68. 1-18 doi:10.1016/0169-4332(93)90211-s
Kohmoto, S., Mizuno, S., Ichimiya, A. (1990) RHEED intensity analysis of Li/Si(111) structures. Applied Surface Science, 41. 107-111 doi:10.1016/0169-4332(89)90041-x
Haderbache, L., Wetzel, P., Pirri, C., Peruchetti, J.C., Bolmont, D., Gewinner, G. (1990) Identification of three distinct CoSi2(111)(1×1) surface structures. Applied Surface Science, 41. 257-261 doi:10.1016/0169-4332(89)90066-4
La Via, F., Ravesi, S., Terrasi, A., Spinella, C. (1993) Formation and characterization of Si/CoSi2/Si epitaxial heterostructures. Applied Surface Science, 73. 135-140 doi:10.1016/0169-4332(93)90157-7
Haderbache, L., Wetzel, P., Pirri, C., Peruchetti, J.C., Bolmont, D., Gewinner, G. (1989) Characterisation by photoemission of the surface structure of epitaxial CoSi2 grown on Si(111) by various preparation techniques. Applied Surface Science, 38. 80-87 doi:10.1016/0169-4332(89)90522-9
(1990) Editorial Board. Applied Surface Science, 41. doi:10.1016/0169-4332(89)90023-8
(1990) Conference organization. Applied Surface Science, 41. doi:10.1016/0169-4332(89)90025-1
Sugahara, Hirohiko, Nagano, Jin (1990) Thermal stability of WSiN-GaAs and Au-WSiN interfaces. Applied Surface Science, 41. 207-211 doi:10.1016/0169-4332(89)90058-5
 
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