Reference Type | Journal (article/letter/editorial) |
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Title | Raman study of strain distribution in interface region of GaAs/GaP heteroepitaxial layers grown by MBE |
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Journal | Applied Surface Science |
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Authors | Takeuchi, Takayuki | Author |
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Maezawa, Chikako | Author |
Nomura, Takashi | Author |
Ishikawa, Kenji | Author |
Miyao, Masahiro | Author |
Hagino, Minoru | Author |
Year | 1990 (January) | Volume | 41 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(89)90116-5Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9894986 | Long-form Identifier | mindat:1:5:9894986:1 |
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GUID | 0 |
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Full Reference | Takeuchi, Takayuki, Maezawa, Chikako, Nomura, Takashi, Ishikawa, Kenji, Miyao, Masahiro, Hagino, Minoru (1990) Raman study of strain distribution in interface region of GaAs/GaP heteroepitaxial layers grown by MBE. Applied Surface Science, 41. 530-533 doi:10.1016/0169-4332(89)90116-5 |
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Plain Text | Takeuchi, Takayuki, Maezawa, Chikako, Nomura, Takashi, Ishikawa, Kenji, Miyao, Masahiro, Hagino, Minoru (1990) Raman study of strain distribution in interface region of GaAs/GaP heteroepitaxial layers grown by MBE. Applied Surface Science, 41. 530-533 doi:10.1016/0169-4332(89)90116-5 |
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In | (n.d.) Applied Surface Science Vol. 41. Elsevier BV |
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