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Nishikawa, Osamu, Kimoto, Masahiro (1994) Toward a scanning atom probe — computer simulation of electric field -. Applied Surface Science, 76. 424-430 doi:10.1016/0169-4332(94)90376-x

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Reference TypeJournal (article/letter/editorial)
TitleToward a scanning atom probe — computer simulation of electric field -
JournalApplied Surface Science
AuthorsNishikawa, OsamuAuthor
Kimoto, MasahiroAuthor
Year1994 (March)Volume76
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(94)90376-xSearch in ResearchGate
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Mindat Ref. ID9897110Long-form Identifiermindat:1:5:9897110:7
GUID0
Full ReferenceNishikawa, Osamu, Kimoto, Masahiro (1994) Toward a scanning atom probe — computer simulation of electric field -. Applied Surface Science, 76. 424-430 doi:10.1016/0169-4332(94)90376-x
Plain TextNishikawa, Osamu, Kimoto, Masahiro (1994) Toward a scanning atom probe — computer simulation of electric field -. Applied Surface Science, 76. 424-430 doi:10.1016/0169-4332(94)90376-x
In(n.d.) Applied Surface Science Vol. 76. Elsevier BV

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Ashino, Makoto, Tomitori, Masahiko, Nishikawa, Osamu (1994) Atom-probe and field emission electron spectroscopy studies of ordered structures and electronic properties of Ge overlayers on Ir-tips. Applied Surface Science, 76. 291-296 doi:10.1016/0169-4332(94)90357-3
Ashino, Makoto, Tomitori, Masahiko, Nishikawa, Osamu (1995) Atom probe and field emission electron spectroscopy studies of semiconductor films on metals. Applied Surface Science, 87. 12-17 doi:10.1016/0169-4332(94)00521-4
Ashino, Makoto, Tomitori, Masahiko, Nishikawa, Osamu (1993) Atom-probe and field emission electron spectroscope studies of Ge on Ir. Applied Surface Science, 67. 43-47 doi:10.1016/0169-4332(93)90292-j
Rolander, Ulf, Andrén, Hans-Olof (1994) Study of proper conditions for quantitative atom-probe analysis. Applied Surface Science, 76. 392-402 doi:10.1016/0169-4332(94)90372-7
Nishikawa, Osamu, Taniguchi, Masahiro, Ikai, Atsushi (2009) Atomic level analysis of biomolecules by the scanning atom probe. Applied Surface Science, 256. 1210-1213 doi:10.1016/j.apsusc.2009.05.154
Nishikawa, Osamu, Akimoto, Taizo, Tsuchiya, Tohru, Yoshimura, Toshihiko, Ishikawa, Yuuichi (1994) Field ion microscope with photostimulable phosphor screen — new approach for quantitative analysis of FIM images-. Applied Surface Science, 76. 359-366 doi:10.1016/0169-4332(94)90368-9
(1994) 40th International field emission symposium. Applied Surface Science, 76. doi:10.1016/0169-4332(94)90306-9
(1994) 40th International field emission symposium. Applied Surface Science, 76. doi:10.1016/0169-4332(94)90311-5
(1994) Summary of discussion at the first workshop on three-dimensional atom-probe analysis — its present and future. Applied Surface Science, 76. doi:10.1016/0169-4332(94)90312-3
Andrén, H.-O., Rolander, U., Lindahl, P. (1994) Atom-probe analysis of cemented carbides and cermets. Applied Surface Science, 76. 278-284 doi:10.1016/0169-4332(94)90355-7
Cerezo, A., Godfrey, T.J., Hyde, J.M., Sijbrandij, S.J., Smith, G.D.W. (1994) Improvements in three-dimensional atom probe design. Applied Surface Science, 76. 374-381 doi:10.1016/0169-4332(94)90370-0
 
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