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Zimin, S.P., Kuznetsov, V.S., Prokaznikov, A.V. (1995) Electrical characteristics of aluminum contacts to porous silicon. Applied Surface Science, 91. 355-358 doi:10.1016/0169-4332(95)00146-8

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Reference TypeJournal (article/letter/editorial)
TitleElectrical characteristics of aluminum contacts to porous silicon
JournalApplied Surface Science
AuthorsZimin, S.P.Author
Kuznetsov, V.S.Author
Prokaznikov, A.V.Author
Year1995 (October)Volume91
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(95)00146-8Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9897911Long-form Identifiermindat:1:5:9897911:8
GUID0
Full ReferenceZimin, S.P., Kuznetsov, V.S., Prokaznikov, A.V. (1995) Electrical characteristics of aluminum contacts to porous silicon. Applied Surface Science, 91. 355-358 doi:10.1016/0169-4332(95)00146-8
Plain TextZimin, S.P., Kuznetsov, V.S., Prokaznikov, A.V. (1995) Electrical characteristics of aluminum contacts to porous silicon. Applied Surface Science, 91. 355-358 doi:10.1016/0169-4332(95)00146-8
In(n.d.) Applied Surface Science Vol. 91. Elsevier BV

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Buchin, E.Yu., Churilov, A.B., Prokaznikov, A.V. (1996) Different morphology aspects of n-type porous silicon. Applied Surface Science, 102. 431-435 doi:10.1016/0169-4332(96)00093-1
Nennewitz, O., Spiess, L., Breternitz, V. (1995) Ohmic contacts to p-type 6H-silicon carbide. Applied Surface Science, 91. 347-351 doi:10.1016/0169-4332(95)00144-1
(1995) Editorial Board. Applied Surface Science, 91. doi:10.1016/0169-4332(95)91919-8
Kulkarni, A.K., Canale, A.J. (1991) Electrical and structural characterization of Co and Ni silicide contacts to silicon. Applied Surface Science, 48. 307-311 doi:10.1016/0169-4332(91)90349-o
(1995) Sponsors. Applied Surface Science, 91. doi:10.1016/0169-4332(95)91923-6
(1995) Conference organization. Applied Surface Science, 91. doi:10.1016/0169-4332(95)91921-x
Demchuk, A.V., Labunov, V.A. (1995) Surface morphology and structure modification of silicon layers induced by nanosecond laser radiation. Applied Surface Science, 86. 353-358 doi:10.1016/0169-4332(94)00428-5
Torres, J. (1995) Advanced copper interconnections for silicon CMOS technologies. Applied Surface Science, 91. 112-123 doi:10.1016/0169-4332(95)00105-0
Weitering, H.H., Sullivan, J.P., Carolissen, R.J., Graham, W.R., Tung, R.T. (1993) Electrical characteristics of silver/silicon contacts. Applied Surface Science, 70. 422-427 doi:10.1016/0169-4332(93)90553-n
(1995) Author index. Applied Surface Science, 91. 388-392 doi:10.1016/0169-4332(95)91925-2
(1995) Subject index. Applied Surface Science, 91. 393-407 doi:10.1016/0169-4332(95)91927-9
 
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