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Fransen, M.J., Damen, E.P.N., Schiller, C., van Rooy, T.L., Groen, H.B., Kruit, P. (1996) Characterization of ultrasharp field emitters by projection microscopy. Applied Surface Science, 94. 107-112 doi:10.1016/0169-4332(95)00358-4

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of ultrasharp field emitters by projection microscopy
JournalApplied Surface Science
AuthorsFransen, M.J.Author
Damen, E.P.N.Author
Schiller, C.Author
van Rooy, T.L.Author
Groen, H.B.Author
Kruit, P.Author
Year1996 (March)Volume94
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(95)00358-4Search in ResearchGate
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Mindat Ref. ID9898114Long-form Identifiermindat:1:5:9898114:0
GUID0
Full ReferenceFransen, M.J., Damen, E.P.N., Schiller, C., van Rooy, T.L., Groen, H.B., Kruit, P. (1996) Characterization of ultrasharp field emitters by projection microscopy. Applied Surface Science, 94. 107-112 doi:10.1016/0169-4332(95)00358-4
Plain TextFransen, M.J., Damen, E.P.N., Schiller, C., van Rooy, T.L., Groen, H.B., Kruit, P. (1996) Characterization of ultrasharp field emitters by projection microscopy. Applied Surface Science, 94. 107-112 doi:10.1016/0169-4332(95)00358-4
In(n.d.) Applied Surface Science Vol. 94. Elsevier BV

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Fransen, M.J, van Rooy, Th.L, Kruit, P (1999) Field emission energy distributions from individual multiwalled carbon nanotubes. Applied Surface Science, 146. 312-327 doi:10.1016/s0169-4332(99)00056-2
Endo, Michiaki, Nakane, Hideaki, Adachi, Hiroshi (1996) Fabrication of transition metal nitride field emitters. Applied Surface Science, 94. 113-116 doi:10.1016/0169-4332(95)00359-2
Konopsky, V.N., Sekatskii, S.K., Letokhov, V.S. (1996) Laser photoelectron projection microscopy with subwavelength spatial resolution. Applied Surface Science, 94. 148-155 doi:10.1016/0169-4332(95)00363-0
Unger, J., Vlasov, Yu.A., Ernst, N. (1995) Probe hole field electron/field ion microscopy and energy spectroscopy of ultrasharp [111]-oriented tungsten tips. Applied Surface Science, 87. 45-52 doi:10.1016/0169-4332(94)00490-0
Zhirnov, V.V., Choi, W.B., Cuomo, J.J., Hren, J.J. (1996) Diamond coated Si and Mo field emitters: diamond thickness effect. Applied Surface Science, 94. 123-128 doi:10.1016/0169-4332(95)00520-x
Fursey, George (1996) Early field emission studies of semiconductors. Applied Surface Science, 94. 44-59 doi:10.1016/0169-4332(95)00518-8
Muñoz-Guillena, M.J, Linares-Solano, A, Salinas-Martínez de Lecea, C (1996) High temperature SO2 retention by CaO. Applied Surface Science, 99. 111-117 doi:10.1016/0169-4332(95)00599-4
Mitterauer, J. (1996) Field emission from thin liquid metal films. Applied Surface Science, 94. 161-170 doi:10.1016/0169-4332(95)00365-7
Forbes, Richard G. (1996) Field-ion imaging old and new. Applied Surface Science, 94. 1-16 doi:10.1016/0169-4332(95)00516-1
Gölzhäuser, Armin (1999) Nanolithography and electron holography with ultrasharp field emitters. Applied Surface Science, 141. 264-273 doi:10.1016/s0169-4332(98)00512-1
Fransen, M.J., Overwijk, M.H.F., Kruit, P. (1999) Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope. Applied Surface Science, 146. 357-362 doi:10.1016/s0169-4332(99)00025-2
 
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