Reference Type | Journal (article/letter/editorial) |
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Title | Temperature measurements during laser ablation of Si into He, Ar and O 2 |
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Journal | Applied Surface Science |
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Authors | Le, H.C | Author |
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Dreyfus, R.W. | Author |
Marine, W. | Author |
Sentis, M. | Author |
Movtchan, I.A | Author |
Year | 1996 (April) | Volume | 96 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(95)00473-4Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9898242 | Long-form Identifier | mindat:1:5:9898242:2 |
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GUID | 0 |
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Full Reference | Le, H.C, Dreyfus, R.W., Marine, W., Sentis, M., Movtchan, I.A (1996) Temperature measurements during laser ablation of Si into He, Ar and O 2. Applied Surface Science, 96. 164-169 doi:10.1016/0169-4332(95)00473-4 |
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Plain Text | Le, H.C, Dreyfus, R.W., Marine, W., Sentis, M., Movtchan, I.A (1996) Temperature measurements during laser ablation of Si into He, Ar and O 2. Applied Surface Science, 96. 164-169 doi:10.1016/0169-4332(95)00473-4 |
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In | (n.d.) Applied Surface Science Vol. 96. Elsevier BV |
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