Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of ZnO thin films deposited by laser ablation in reactive atmosphere |
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Journal | Applied Surface Science |
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Authors | Verardi, P. | Author |
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Dinescu, M. | Author |
Andrei, A. | Author |
Year | 1996 (April) | Volume | 96 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(95)00591-9Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9898339 | Long-form Identifier | mindat:1:5:9898339:7 |
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GUID | 0 |
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Full Reference | Verardi, P., Dinescu, M., Andrei, A. (1996) Characterization of ZnO thin films deposited by laser ablation in reactive atmosphere. Applied Surface Science, 96. 827-830 doi:10.1016/0169-4332(95)00591-9 |
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Plain Text | Verardi, P., Dinescu, M., Andrei, A. (1996) Characterization of ZnO thin films deposited by laser ablation in reactive atmosphere. Applied Surface Science, 96. 827-830 doi:10.1016/0169-4332(95)00591-9 |
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In | (n.d.) Applied Surface Science Vol. 96. Elsevier BV |
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