Reference Type | Journal (article/letter/editorial) |
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Title | XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface |
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Journal | Applied Surface Science |
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Authors | Chiarello, G. | Author |
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Barberi, R. | Author |
Amoddeo, A. | Author |
Caputi, L.S. | Author |
Colavita, E. | Author |
Year | 1996 (May) | Volume | 99 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(95)00451-3Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9898357 | Long-form Identifier | mindat:1:5:9898357:3 |
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GUID | 0 |
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Full Reference | Chiarello, G., Barberi, R., Amoddeo, A., Caputi, L.S., Colavita, E. (1996) XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface. Applied Surface Science, 99. 15-19 doi:10.1016/0169-4332(95)00451-3 |
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Plain Text | Chiarello, G., Barberi, R., Amoddeo, A., Caputi, L.S., Colavita, E. (1996) XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface. Applied Surface Science, 99. 15-19 doi:10.1016/0169-4332(95)00451-3 |
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In | (n.d.) Applied Surface Science Vol. 99. Elsevier BV |
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