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Marinova, Ts., Krastev, V., Hallin, C., Yakimova, R., Janzén, E. (1996) Interface chemistry and electric characterisation of nickel metallisation on 6HSiC. Applied Surface Science, 99. 119-125 doi:10.1016/0169-4332(95)00514-5

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Reference TypeJournal (article/letter/editorial)
TitleInterface chemistry and electric characterisation of nickel metallisation on 6HSiC
JournalApplied Surface Science
AuthorsMarinova, Ts.Author
Krastev, V.Author
Hallin, C.Author
Yakimova, R.Author
Janzén, E.Author
Year1996 (June)Volume99
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(95)00514-5Search in ResearchGate
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Mindat Ref. ID9898367Long-form Identifiermindat:1:5:9898367:0
GUID0
Full ReferenceMarinova, Ts., Krastev, V., Hallin, C., Yakimova, R., Janzén, E. (1996) Interface chemistry and electric characterisation of nickel metallisation on 6HSiC. Applied Surface Science, 99. 119-125 doi:10.1016/0169-4332(95)00514-5
Plain TextMarinova, Ts., Krastev, V., Hallin, C., Yakimova, R., Janzén, E. (1996) Interface chemistry and electric characterisation of nickel metallisation on 6HSiC. Applied Surface Science, 99. 119-125 doi:10.1016/0169-4332(95)00514-5
In(n.d.) Applied Surface Science Vol. 99. Elsevier BV

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Marinova, Ts., Krastev, V., Hallin, Christer, Yakimova, Rositza, Janzén, Erik (1996) XPS Study of Ni Layers Deposited on 6H-SiC. Materials Science Forum, 207. 293-296 doi:10.4028/www.scientific.net/msf.207-209.293
Dimova-Malinovska, D., Tzolov, M., Malinowski, N., Marinova, Ts., Krastev, V. (1996) Laser-induced formation of visible light emitting silicon. Applied Surface Science, 96. 457-462 doi:10.1016/0169-4332(95)00458-0
Kakanakova-Georgieva, A, Kassamakova, L, Marinova, Ts, Kakanakov, R, Noblanc, O, Arnodo, C, Cassette, S, Brylinski, C (1999) Interface chemistry of WN/4H–SiC structures. Applied Surface Science, 151. 225-232 doi:10.1016/s0169-4332(99)00277-9
Mihailova, Ts., Velchev, N., Krastev, V., Marinova, Ts. (1997) XPS study of residual oxide layers on p-GaAs surfaces. Applied Surface Science, 120. 213-219 doi:10.1016/s0169-4332(97)00249-3
Kakanakova-Georgieva, A., Marinova, Ts., Noblanc, O., Arnodo, C., Cassette, S., Brylinski, C. (1997) Interface chemistry of a Ti/Au/Pt/Ti/SiC structure. Applied Surface Science, 121. 208-212 doi:10.1016/s0169-4332(97)00290-0
Behner, H., Rupp, R. (1996) Surface composition of CVD-grown α-SiC layers — an XPS and LEED study. Applied Surface Science, 99. 27-33 doi:10.1016/0169-4332(95)00511-0
Kordina, O., Bergman, J. P., Hallin, C., Janzén, E. (1996) The minority carrier lifetime of n‐type 4H‐ and 6H‐SiC epitaxial layers. Applied Physics Letters, 69 (5). 679-681 doi:10.1063/1.117804
Gladkov, P., Varblianska, K., Marinova, Ts., Krastev, V., Stoemenos, J. (1992) Characterization of thermally oxidized Ta/GaAs Schottky barrier structures prepared by low energy RF sputtering with X-ray photoemission, TEM and optical transmittance measurements. Applied Surface Science, 59. 179-185 doi:10.1016/0169-4332(92)90116-f
Kakanakova-Georgieva, A., Yakimova, R., Syväjärvi, M., Janzén, E. (2001) Behavior of background impurities in thick 4H–SiC epitaxial layers. Applied Surface Science, 184. 242-246 doi:10.1016/s0169-4332(01)00495-0
Coluzza, C. (1996) Ultra accurate measurements of interface parameters with free-electron laser. Applied Surface Science, 92. 267-272 doi:10.1016/0169-4332(95)00240-5
Kalitzova, M, Karpuzov, D, Marinova, Ts, Krastev, V, Vitali, G, Pizzuto, C, Zollo, G (1997) InP crystals-ion implantation and laser annealing: RHEED, XPS and computer simulation studies. Applied Surface Science, 115. 1-9 doi:10.1016/s0169-4332(96)00855-0
 
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