Reference Type | Journal (article/letter/editorial) |
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Title | XPS study of carbon/inconel bilayers as a function of substrate bias |
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Journal | Applied Surface Science |
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Authors | Aouadi, M.S. | Author |
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Wong, P.C. | Author |
Mitchell, K.A.R. | Author |
Year | 1996 (August) | Volume | 99 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(96)80017-1Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9898404 | Long-form Identifier | mindat:1:5:9898404:0 |
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GUID | 0 |
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Full Reference | Aouadi, M.S., Wong, P.C., Mitchell, K.A.R. (1996) XPS study of carbon/inconel bilayers as a function of substrate bias. Applied Surface Science, 99. 319-324 doi:10.1016/0169-4332(96)80017-1 |
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Plain Text | Aouadi, M.S., Wong, P.C., Mitchell, K.A.R. (1996) XPS study of carbon/inconel bilayers as a function of substrate bias. Applied Surface Science, 99. 319-324 doi:10.1016/0169-4332(96)80017-1 |
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In | (n.d.) Applied Surface Science Vol. 99. Elsevier BV |
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