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Zemek, J, Zalman, J, Luches, A (1998) XAES and XPS study of amorphous carbon nitride layers. Applied Surface Science, 133. 27-32 doi:10.1016/s0169-4332(98)00181-0

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Reference TypeJournal (article/letter/editorial)
TitleXAES and XPS study of amorphous carbon nitride layers
JournalApplied Surface Science
AuthorsZemek, JAuthor
Zalman, JAuthor
Luches, AAuthor
Year1998 (May)Volume133
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00181-0Search in ResearchGate
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Mindat Ref. ID9900503Long-form Identifiermindat:1:5:9900503:0
GUID0
Full ReferenceZemek, J, Zalman, J, Luches, A (1998) XAES and XPS study of amorphous carbon nitride layers. Applied Surface Science, 133. 27-32 doi:10.1016/s0169-4332(98)00181-0
Plain TextZemek, J, Zalman, J, Luches, A (1998) XAES and XPS study of amorphous carbon nitride layers. Applied Surface Science, 133. 27-32 doi:10.1016/s0169-4332(98)00181-0
In(n.d.) Applied Surface Science Vol. 133. Elsevier BV

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van Elsbergen, V, Rohleder, M, Mönch, W (1998) Formation of nitride layers on 6H-SiC surfaces. Applied Surface Science, 134. 197-201 doi:10.1016/s0169-4332(98)00219-0
Brenier, R, Mugnier, J, Mirica, E (1999) XPS study of amorphous zirconium oxide films prepared by sol–gel. Applied Surface Science, 143. 85-91 doi:10.1016/s0169-4332(98)00901-5
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Perrone, A, Caricato, A.P, Luches, A, Dinescu, M, Ghica, C, Sandu, V, Andrei, A (1998) Boron carbonitride films deposited by pulsed laser ablation. Applied Surface Science, 133. 239-242 doi:10.1016/s0169-4332(98)00207-4
Wei, Z.B.Zhaobin, Grange, P., Delmon, B. (1998) XPS and XRD studies of fresh and sulfided Mo2N. Applied Surface Science, 135. 107-114 doi:10.1016/s0169-4332(98)00267-0
D'Anna, E., Luches, A., Perrone, A., Acquaviva, S., Alexandrescu, R., Mihailescu, I.N., Zemek, J., Majni, G. (1996) Deposition of Cî—¸N films by reactive laser ablation. Applied Surface Science, 106. 126-131 doi:10.1016/s0169-4332(96)00374-1
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Lascovich, J.C., Giorgi, R., Scaglione, S. (1991) Evaluation of the sp2/sp3 ratio in amorphous carbon structure by XPS and XAES. Applied Surface Science, 47. 17-21 doi:10.1016/0169-4332(91)90098-5
 
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