Wiame, F, Mathot, G, Sivananthan, S, Rujirawat, S, Caudano, R, Sporken, R (1999) STM study of the Te/Si(100) interface. Applied Surface Science, 142. 475-480 doi:10.1016/s0169-4332(98)00686-2
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | STM study of the Te/Si(100) interface | ||
Journal | Applied Surface Science | ||
Authors | Wiame, F | Author | |
Mathot, G | Author | ||
Sivananthan, S | Author | ||
Rujirawat, S | Author | ||
Caudano, R | Author | ||
Sporken, R | Author | ||
Year | 1999 (April) | Volume | 142 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(98)00686-2Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9901002 | Long-form Identifier | mindat:1:5:9901002:3 |
GUID | 0 | ||
Full Reference | Wiame, F, Mathot, G, Sivananthan, S, Rujirawat, S, Caudano, R, Sporken, R (1999) STM study of the Te/Si(100) interface. Applied Surface Science, 142. 475-480 doi:10.1016/s0169-4332(98)00686-2 | ||
Plain Text | Wiame, F, Mathot, G, Sivananthan, S, Rujirawat, S, Caudano, R, Sporken, R (1999) STM study of the Te/Si(100) interface. Applied Surface Science, 142. 475-480 doi:10.1016/s0169-4332(98)00686-2 | ||
In | (n.d.) Applied Surface Science Vol. 142. Elsevier BV |
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