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Amadelli, R, Armelao, L, Tondello, E, Daolio, S, Fabrizio, M, Pagura, C, Velichenko, A (1999) A SIMS and XPS study about ions influence on electrodeposited PbO2 films. Applied Surface Science, 142. 200-203 doi:10.1016/s0169-4332(98)00707-7

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Reference TypeJournal (article/letter/editorial)
TitleA SIMS and XPS study about ions influence on electrodeposited PbO2 films
JournalApplied Surface Science
AuthorsAmadelli, RAuthor
Armelao, LAuthor
Tondello, EAuthor
Daolio, SAuthor
Fabrizio, MAuthor
Pagura, CAuthor
Velichenko, AAuthor
Year1999 (April)Volume142
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00707-7Search in ResearchGate
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Mindat Ref. ID9901023Long-form Identifiermindat:1:5:9901023:6
GUID0
Full ReferenceAmadelli, R, Armelao, L, Tondello, E, Daolio, S, Fabrizio, M, Pagura, C, Velichenko, A (1999) A SIMS and XPS study about ions influence on electrodeposited PbO2 films. Applied Surface Science, 142. 200-203 doi:10.1016/s0169-4332(98)00707-7
Plain TextAmadelli, R, Armelao, L, Tondello, E, Daolio, S, Fabrizio, M, Pagura, C, Velichenko, A (1999) A SIMS and XPS study about ions influence on electrodeposited PbO2 films. Applied Surface Science, 142. 200-203 doi:10.1016/s0169-4332(98)00707-7
In(n.d.) Applied Surface Science Vol. 142. Elsevier BV

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Amadelli, R, Velichenko, A.B, Tondello, E, Armelao, L, Daolio, S, Fabrizio, M (1998) Ion bombardment of PbO2 films: water influence of cluster production. International Journal of Mass Spectrometry, 179. 309-317 doi:10.1016/s1387-3806(98)14142-8
Barison, S., Daolio, S., Fabrizio, M., Piccirillo, C., Calliari, I., Armelao, L. (2000) Characterization of Dispersion-Hardened Electrodeposited Gold Composites. Part 1:Ā  SIMS and SEM Study of Powder Inclusions. Chemistry of Materials, 12. 2964-2970 doi:10.1021/cm001051y
Bersani, M, Vanzetti, L, Sbetti, M, Anderle, M (1999) Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses. Applied Surface Science, 144. 301-305 doi:10.1016/s0169-4332(98)00814-9
Brenier, R, Mugnier, J, Mirica, E (1999) XPS study of amorphous zirconium oxide films prepared by solā€“gel. Applied Surface Science, 143. 85-91 doi:10.1016/s0169-4332(98)00901-5
Franzreb, Klaus, Williams, Peter (2003) Mass-resolved low-energy back-scattering of alkali ions. Applied Surface Science, 203. 98-101 doi:10.1016/s0169-4332(02)00707-9
Lozano, J., Craig, J.H., Campbell, J.H. (1999) A TPD, HREELS, and XPS study of electron-induced deposition of germanium on Si(100). Applied Surface Science, 137. 197-203 doi:10.1016/s0169-4332(98)00497-8
Velichenko, A.B, Portillo, J, Sarret, M, Muller, C (1999) Surface analysis of films formed on a zinc anode in a Znā€“Ni electroplating bath. Applied Surface Science, 148. 17-23 doi:10.1016/s0169-4332(99)00140-3
Battistoni, C, Cantelli, V, Debenedetti, M, Kačiulis, S, Mattogno, G, Napoli, A (1999) XPS study of ceramic three-way catalysts. Applied Surface Science, 144. 390-394 doi:10.1016/s0169-4332(98)00832-0
Detroye, M, Reniers, F, Buess-Herman, C, Vereecken, J (1999) AESā€“XPS study of chromium carbides and chromium iron carbides. Applied Surface Science, 144. 78-82 doi:10.1016/s0169-4332(98)00769-7
Inoue, Ryo, Kitagawa, Masahiko, Nishigaki, Takayoshi, Morita, Daisuke, Ichino, Kunio, Kusano, Hiroyuki, Kobayashi, Hiroshi (1999) XPS study of ZnxMg1āˆ’xS:Mn ternary compound thin films. Applied Surface Science, 142. 341-345 doi:10.1016/s0169-4332(98)00672-2
Lothongkum, G, Chaikittisilp, S, Lothongkum, A.W (2003) XPS investigation of surface films on high Cr-Ni ferritic and austenitic stainless steels. Applied Surface Science, 218. 203-210 doi:10.1016/s0169-4332(03)00600-7
 
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