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Schreckenbach, Joachim P., Strauch, Peter (1999) Microstructure study of amorphous vanadium oxide films. Applied Surface Science, 143. 6-10 doi:10.1016/s0169-4332(99)00084-7

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Reference TypeJournal (article/letter/editorial)
TitleMicrostructure study of amorphous vanadium oxide films
JournalApplied Surface Science
AuthorsSchreckenbach, Joachim P.Author
Strauch, PeterAuthor
Year1999 (April)Volume143
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00084-7Search in ResearchGate
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Mindat Ref. ID9901105Long-form Identifiermindat:1:5:9901105:9
GUID0
Full ReferenceSchreckenbach, Joachim P., Strauch, Peter (1999) Microstructure study of amorphous vanadium oxide films. Applied Surface Science, 143. 6-10 doi:10.1016/s0169-4332(99)00084-7
Plain TextSchreckenbach, Joachim P., Strauch, Peter (1999) Microstructure study of amorphous vanadium oxide films. Applied Surface Science, 143. 6-10 doi:10.1016/s0169-4332(99)00084-7
In(n.d.) Applied Surface Science Vol. 143. Elsevier BV

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