Harzl, M, Leisch, M (1999) Imaging atom probe study of the segregation behaviour of Nb–Ta binary alloys. Applied Surface Science, 144. 41-44 doi:10.1016/s0169-4332(98)00761-2
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Imaging atom probe study of the segregation behaviour of Nb–Ta binary alloys | ||
Journal | Applied Surface Science | ||
Authors | Harzl, M | Author | |
Leisch, M | Author | ||
Year | 1999 (April) | Volume | 144 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(98)00761-2Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9901132 | Long-form Identifier | mindat:1:5:9901132:3 |
GUID | 0 | ||
Full Reference | Harzl, M, Leisch, M (1999) Imaging atom probe study of the segregation behaviour of Nb–Ta binary alloys. Applied Surface Science, 144. 41-44 doi:10.1016/s0169-4332(98)00761-2 | ||
Plain Text | Harzl, M, Leisch, M (1999) Imaging atom probe study of the segregation behaviour of Nb–Ta binary alloys. Applied Surface Science, 144. 41-44 doi:10.1016/s0169-4332(98)00761-2 | ||
In | (n.d.) Applied Surface Science Vol. 144. Elsevier BV |
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