Reference Type | Journal (article/letter/editorial) |
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Title | CeO2 on Si(111) 7×7 and Si(111)–H 1×1, an interface study by high-resolution photoelectron spectroscopy |
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Journal | Applied Surface Science |
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Authors | Hirschauer, B | Author |
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Göthelid, M | Author |
Janin, E | Author |
Lu, H | Author |
Karlsson, U.O | Author |
Year | 1999 (July) | Volume | 148 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(99)00218-4Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9901400 | Long-form Identifier | mindat:1:5:9901400:1 |
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GUID | 0 |
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Full Reference | Hirschauer, B, Göthelid, M, Janin, E, Lu, H, Karlsson, U.O (1999) CeO2 on Si(111) 7×7 and Si(111)–H 1×1, an interface study by high-resolution photoelectron spectroscopy. Applied Surface Science, 148. 164-170 doi:10.1016/s0169-4332(99)00218-4 |
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Plain Text | Hirschauer, B, Göthelid, M, Janin, E, Lu, H, Karlsson, U.O (1999) CeO2 on Si(111) 7×7 and Si(111)–H 1×1, an interface study by high-resolution photoelectron spectroscopy. Applied Surface Science, 148. 164-170 doi:10.1016/s0169-4332(99)00218-4 |
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In | (n.d.) Applied Surface Science Vol. 148. Elsevier BV |
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