Reference Type | Journal (article/letter/editorial) |
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Title | Deposition and annealing of tantalum pentoxide films using 172 nm excimer lamp |
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Journal | Applied Surface Science |
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Authors | Zhang, Jun-Ying | Author |
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Lim, Boon | Author |
Boyd, Ian W | Author |
Year | 2000 (February) | Volume | 154 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(99)00387-6Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9901636 | Long-form Identifier | mindat:1:5:9901636:4 |
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GUID | 0 |
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Full Reference | Zhang, Jun-Ying, Lim, Boon, Boyd, Ian W (2000) Deposition and annealing of tantalum pentoxide films using 172 nm excimer lamp. Applied Surface Science, 154. 382-386 doi:10.1016/s0169-4332(99)00387-6 |
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Plain Text | Zhang, Jun-Ying, Lim, Boon, Boyd, Ian W (2000) Deposition and annealing of tantalum pentoxide films using 172 nm excimer lamp. Applied Surface Science, 154. 382-386 doi:10.1016/s0169-4332(99)00387-6 |
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In | (n.d.) Applied Surface Science Vol. 154. Elsevier BV |
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