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Okabe, Yoh, Akiba, Uichi, Fujihira, Masamichi (2000) Chemical force microscopy of CH3 and COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy. Applied Surface Science, 157. 398-404 doi:10.1016/s0169-4332(99)00557-7

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Reference TypeJournal (article/letter/editorial)
TitleChemical force microscopy of CH3 and COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy
JournalApplied Surface Science
AuthorsOkabe, YohAuthor
Akiba, UichiAuthor
Fujihira, MasamichiAuthor
Year2000 (April)Volume157
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00557-7Search in ResearchGate
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Mindat Ref. ID9901822Long-form Identifiermindat:1:5:9901822:9
GUID0
Full ReferenceOkabe, Yoh, Akiba, Uichi, Fujihira, Masamichi (2000) Chemical force microscopy of CH3 and COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy. Applied Surface Science, 157. 398-404 doi:10.1016/s0169-4332(99)00557-7
Plain TextOkabe, Yoh, Akiba, Uichi, Fujihira, Masamichi (2000) Chemical force microscopy of CH3 and COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy. Applied Surface Science, 157. 398-404 doi:10.1016/s0169-4332(99)00557-7
In(n.d.) Applied Surface Science Vol. 157. Elsevier BV

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Okabe, Yoh, Furugori, Manabu, Tani, Yuki, Akiba, Uichi, Fujihira, Masamichi (2000) Chemical force microscopy of microcontact-printed self-assembled monolayers by pulsed-force-mode atomic force microscopy. Ultramicroscopy, 82 (1). 203-212 doi:10.1016/s0304-3991(99)00143-6
Fujihira, Masamichi, Tani, Yuki, Furugori, Manabu, Akiba, Uichi, Okabe, Yoh (2001) Chemical force microscopy of self-assembled monolayers on sputtered gold films patterned by phase separation. Ultramicroscopy, 86 (1). 63-73 doi:10.1016/s0304-3991(00)00100-5
Nakasa, Akihiko, Akiba, Uichi, Fujihira, Masamichi (2000) Self-assembled monolayers containing biphenyl derivatives as challenge for nc-AFM. Applied Surface Science, 157. 326-331 doi:10.1016/s0169-4332(99)00567-x
Fujii, Shintaro, Akiba, Uichi, Fujihira, Masamichi (2003) A self-assembled monolayer of a disulfide with a pair of bicyclo[2.2.2]octane moieties on Au(1 1 1) investigated by non-contact atomic force microscopy. Applied Surface Science, 210. 79-83 doi:10.1016/s0169-4332(02)01483-6
Yagi, Kazuto, Fujihira, Masamichi (2000) Study of mixed Langmuir–Blodgett films of hydrocarbon and fluorocarbon amphiphilic compounds by scanning surface potential microscopy and friction force microscopy. Applied Surface Science, 157. 405-411 doi:10.1016/s0169-4332(99)00558-9
Fujihira, Masamichi, Okabe, Yoh, Tani, Yuki, Furugori, Manabu, Akiba, Uichi (2000) A novel cleaning method of gold-coated atomic force microscope tips for their chemical modification. Ultramicroscopy, 82 (1). 181-191 doi:10.1016/s0304-3991(99)00144-8
Arai, T, Tomitori, M (2000) Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy. Applied Surface Science, 157. 207-211 doi:10.1016/s0169-4332(99)00527-9
Fujihira, Masamichi, Furugori, Manabu, Akiba, Uichi, Tani, Yuki (2001) Study of microcontact printed patterns by chemical force microscopy. Ultramicroscopy, 86 (1). 75-83 doi:10.1016/s0304-3991(00)00109-1
Hayashi, Kazuyuki, Sugimura, Hiroyuki, Takai, Osamu (2002) Force microscopy contrasts due to adhesion force difference between organosilane self-assembled monolayers. Applied Surface Science, 188. 513-518 doi:10.1016/s0169-4332(01)00963-1
Nishi, Ryuji, Houda, Isao, Aramata, Tomohide, Sugawara, Yasuhiro, Morita, Seizo (2000) Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy. Applied Surface Science, 157. 332-336 doi:10.1016/s0169-4332(99)00547-4
Sato, Fuminobu, Okui, Hiroki, Akiba, Uichi, Suga, Kosaku, Fujihira, Masamichi (2003) A study of topographic effects on chemical force microscopy using adhesive force mapping. Ultramicroscopy, 97 (1). 303-314 doi:10.1016/s0304-3991(03)00056-1
 
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