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Ramdani, J, Droopad, R, Yu, Z, Curless, J.A, Overgaard, C.D, Finder, J, Eisenbeiser, K, Hallmark, J.A, Ooms, W.J, Kaushik, V, Alluri, P, Pietambaram, S (2000) Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy. Applied Surface Science, 159. 127-133 doi:10.1016/s0169-4332(00)00050-7

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Reference TypeJournal (article/letter/editorial)
TitleInterface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy
JournalApplied Surface Science
AuthorsRamdani, JAuthor
Droopad, RAuthor
Yu, ZAuthor
Curless, J.AAuthor
Overgaard, C.DAuthor
Finder, JAuthor
Eisenbeiser, KAuthor
Hallmark, J.AAuthor
Ooms, W.JAuthor
Kaushik, VAuthor
Alluri, PAuthor
Pietambaram, SAuthor
Year2000 (June)Volume159
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(00)00050-7Search in ResearchGate
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Mindat Ref. ID9901890Long-form Identifiermindat:1:5:9901890:0
GUID0
Full ReferenceRamdani, J, Droopad, R, Yu, Z, Curless, J.A, Overgaard, C.D, Finder, J, Eisenbeiser, K, Hallmark, J.A, Ooms, W.J, Kaushik, V, Alluri, P, Pietambaram, S (2000) Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy. Applied Surface Science, 159. 127-133 doi:10.1016/s0169-4332(00)00050-7
Plain TextRamdani, J, Droopad, R, Yu, Z, Curless, J.A, Overgaard, C.D, Finder, J, Eisenbeiser, K, Hallmark, J.A, Ooms, W.J, Kaushik, V, Alluri, P, Pietambaram, S (2000) Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy. Applied Surface Science, 159. 127-133 doi:10.1016/s0169-4332(00)00050-7
In(n.d.) Applied Surface Science Vol. 159. Elsevier BV


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