Ramdani, J, Droopad, R, Yu, Z, Curless, J.A, Overgaard, C.D, Finder, J, Eisenbeiser, K, Hallmark, J.A, Ooms, W.J, Kaushik, V, Alluri, P, Pietambaram, S (2000) Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy. Applied Surface Science, 159. 127-133 doi:10.1016/s0169-4332(00)00050-7
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy | ||
Journal | Applied Surface Science | ||
Authors | Ramdani, J | Author | |
Droopad, R | Author | ||
Yu, Z | Author | ||
Curless, J.A | Author | ||
Overgaard, C.D | Author | ||
Finder, J | Author | ||
Eisenbeiser, K | Author | ||
Hallmark, J.A | Author | ||
Ooms, W.J | Author | ||
Kaushik, V | Author | ||
Alluri, P | Author | ||
Pietambaram, S | Author | ||
Year | 2000 (June) | Volume | 159 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(00)00050-7Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9901890 | Long-form Identifier | mindat:1:5:9901890:0 |
GUID | 0 | ||
Full Reference | Ramdani, J, Droopad, R, Yu, Z, Curless, J.A, Overgaard, C.D, Finder, J, Eisenbeiser, K, Hallmark, J.A, Ooms, W.J, Kaushik, V, Alluri, P, Pietambaram, S (2000) Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy. Applied Surface Science, 159. 127-133 doi:10.1016/s0169-4332(00)00050-7 | ||
Plain Text | Ramdani, J, Droopad, R, Yu, Z, Curless, J.A, Overgaard, C.D, Finder, J, Eisenbeiser, K, Hallmark, J.A, Ooms, W.J, Kaushik, V, Alluri, P, Pietambaram, S (2000) Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy. Applied Surface Science, 159. 127-133 doi:10.1016/s0169-4332(00)00050-7 | ||
In | (n.d.) Applied Surface Science Vol. 159. Elsevier BV |
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