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Yalcin, Senay, Avci, Recep (2003) Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction. Applied Surface Science, 214. 319-337 doi:10.1016/s0169-4332(03)00519-1

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction
JournalApplied Surface Science
AuthorsYalcin, SenayAuthor
Avci, RecepAuthor
Year2003 (May)Volume214
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00519-1Search in ResearchGate
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Mindat Ref. ID9905196Long-form Identifiermindat:1:5:9905196:9
GUID0
Full ReferenceYalcin, Senay, Avci, Recep (2003) Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction. Applied Surface Science, 214. 319-337 doi:10.1016/s0169-4332(03)00519-1
Plain TextYalcin, Senay, Avci, Recep (2003) Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction. Applied Surface Science, 214. 319-337 doi:10.1016/s0169-4332(03)00519-1
In(n.d.) Applied Surface Science Vol. 214. Elsevier BV

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