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Maeda, Keiji (2003) Process-induced defects and potential distribution in nearly ideal Au/Si Schottky barriers. Applied Surface Science, 216. 198-202 doi:10.1016/s0169-4332(03)00437-9

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Reference TypeJournal (article/letter/editorial)
TitleProcess-induced defects and potential distribution in nearly ideal Au/Si Schottky barriers
JournalApplied Surface Science
AuthorsMaeda, KeijiAuthor
Year2003 (June)Volume216
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00437-9Search in ResearchGate
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Mindat Ref. ID9905293Long-form Identifiermindat:1:5:9905293:1
GUID0
Full ReferenceMaeda, Keiji (2003) Process-induced defects and potential distribution in nearly ideal Au/Si Schottky barriers. Applied Surface Science, 216. 198-202 doi:10.1016/s0169-4332(03)00437-9
Plain TextMaeda, Keiji (2003) Process-induced defects and potential distribution in nearly ideal Au/Si Schottky barriers. Applied Surface Science, 216. 198-202 doi:10.1016/s0169-4332(03)00437-9
In(n.d.) Applied Surface Science Vol. 216. Elsevier BV

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Maeda, Keiji (2002) Identity of defect causing nonideality in nearly ideal Au/n-Si Schottky barriers. Applied Surface Science, 190. 445-449 doi:10.1016/s0169-4332(01)00913-8
Maeda, Keiji (2000) Defect causing nonideality in nearly ideal Au/Si Schottky barrier. Applied Surface Science, 159. 154-160 doi:10.1016/s0169-4332(00)00070-2
MAEDA, K (2004) Energy level broadening of defects causing nonideality in nearly ideal Si Schottky barriers. Applied Surface Science, 237. 165-169 doi:10.1016/s0169-4332(04)01005-0
Maeda, Keiji (2006) Nonideality of Au/Si and Au/GaAs Schottky barriers due to process-induced defects. Applied Surface Science, 252. 5659-5675 doi:10.1016/j.apsusc.2005.07.074
Maeda, Keiji, Kitahara, Eiji (1998) Metal-induced gap states model of nonideal Au/Si Schottky barrier with low defect density. Applied Surface Science, 130. 925-929 doi:10.1016/s0169-4332(98)00178-0
Kitagawa, Isao, Maruizumi, Takuya (2003) New intrinsic pair defects in silicon dioxide interface. Applied Surface Science, 216. 264-269 doi:10.1016/s0169-4332(03)00379-9
Manke, C., Bodschwinna, Y., Schulz, M. (1997) Electron emission microscopy on Au/Si and silicide/Si Schottky barriers. Applied Surface Science, 117. 321-328 doi:10.1016/s0169-4332(97)80102-x
(2003) Editorial Board. Applied Surface Science, 216. doi:10.1016/s0169-4332(03)00776-1
(2003) Author Index. Applied Surface Science, 216. doi:10.1016/s0169-4332(03)00784-0
(2003) Subject Index. Applied Surface Science, 216. doi:10.1016/s0169-4332(03)00785-2
Adams, Daniel, Julies, B.A, Mayer, J.W, Alford, T.L (2003) The effect of metals (Au, Ag) and oxidizing ambient on interfacial reactions in Au/Si and Ag/Si systems. Applied Surface Science, 216. 163-168 doi:10.1016/s0169-4332(03)00513-0
 
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