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Tanner, R.E., Szekeres, A., Gogova, D., Gesheva, K. (2003) Study of the surface roughness of CVD-tungsten oxide thin films. Applied Surface Science, 218. 163-169 doi:10.1016/s0169-4332(03)00575-0

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Reference TypeJournal (article/letter/editorial)
TitleStudy of the surface roughness of CVD-tungsten oxide thin films
JournalApplied Surface Science
AuthorsTanner, R.E.Author
Szekeres, A.Author
Gogova, D.Author
Gesheva, K.Author
Year2003 (September)Volume218
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00575-0Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9905422Long-form Identifiermindat:1:5:9905422:1
GUID0
Full ReferenceTanner, R.E., Szekeres, A., Gogova, D., Gesheva, K. (2003) Study of the surface roughness of CVD-tungsten oxide thin films. Applied Surface Science, 218. 163-169 doi:10.1016/s0169-4332(03)00575-0
Plain TextTanner, R.E., Szekeres, A., Gogova, D., Gesheva, K. (2003) Study of the surface roughness of CVD-tungsten oxide thin films. Applied Surface Science, 218. 163-169 doi:10.1016/s0169-4332(03)00575-0
In(n.d.) Applied Surface Science Vol. 218. Elsevier BV

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Szekeres, A, Gogova, D, Gesheva, K (1999) Optical properties of thin CVD-tungsten oxide films by spectroscopic ellipsometry. Journal of Crystal Growth, 198. 1235-1239 doi:10.1016/s0022-0248(98)00993-2
Soto, G (2003) Characterization of tungsten oxide films produced by reactive pulsed laser deposition. Applied Surface Science, 218. 282-290 doi:10.1016/s0169-4332(03)00677-9
Gogova, D., Gesheva, K., Szekeres, A., Sendova-Vassileva, M. (1999) Structural and Optical Properties of CVD Thin Tungsten Oxide Films. physica status solidi (a), 176 (2). 969-984 doi:10.1002/(sici)1521-396x(199912)176:2<969::aid-pssa969>3.0.co;2-9
Stamate, Marius D. (2003) On the dielectric properties of dc magnetron TiO2 thin films. Applied Surface Science, 218. 318-323 doi:10.1016/s0169-4332(03)00624-x
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Ivanova, T., Szekeres, A., Gartner, M., Gogova, D., Gesheva, K.A. (2001) Spectroscopic characterization of CVD-molybdenum oxide films. Electrochimica Acta, 46 (13). 2215-2219 doi:10.1016/s0013-4686(01)00404-2
Gesheva, K.A., Krisov, T.A., Simkov, U.I., Beshkov, G.D. (1993) Deposition and study of CVD—tungsten and molybdenum thin films and their impact on microelectronics technology. Applied Surface Science, 73. 86-89 doi:10.1016/0169-4332(93)90150-a
(2003) Author Index. Applied Surface Science, 218. doi:10.1016/s0169-4332(03)00974-7
(2003) Subject Index. Applied Surface Science, 218. doi:10.1016/s0169-4332(03)00975-9
Kawakami, Yuji, Ozawa, Eiichi (2003) Tungsten microcone growth by laser irradiation. Applied Surface Science, 218. 176-188 doi:10.1016/s0169-4332(03)00615-9
Szanyi, János (2002) The origin of haze in CVD tin oxide thin films. Applied Surface Science, 185. 161-171 doi:10.1016/s0169-4332(01)00554-2
 
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