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Suominen, T, Paturi, P, Huhtinen, H, Heikkilä, L, Hedman, H.-P, Punkkinen, R, Laiho, R (2004) Conductivity and distribution of charge on electroluminescent Si/SiO2 structures investigated by electrostatic force microscopy. Applied Surface Science, 222. 131-137 doi:10.1016/j.apsusc.2003.08.004

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Reference TypeJournal (article/letter/editorial)
TitleConductivity and distribution of charge on electroluminescent Si/SiO2 structures investigated by electrostatic force microscopy
JournalApplied Surface Science
AuthorsSuominen, TAuthor
Paturi, PAuthor
Huhtinen, HAuthor
Heikkilä, LAuthor
Hedman, H.-PAuthor
Punkkinen, RAuthor
Laiho, RAuthor
Year2004 (January)Volume222
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2003.08.004Search in ResearchGate
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Mindat Ref. ID9905622Long-form Identifiermindat:1:5:9905622:9
GUID0
Full ReferenceSuominen, T, Paturi, P, Huhtinen, H, Heikkilä, L, Hedman, H.-P, Punkkinen, R, Laiho, R (2004) Conductivity and distribution of charge on electroluminescent Si/SiO2 structures investigated by electrostatic force microscopy. Applied Surface Science, 222. 131-137 doi:10.1016/j.apsusc.2003.08.004
Plain TextSuominen, T, Paturi, P, Huhtinen, H, Heikkilä, L, Hedman, H.-P, Punkkinen, R, Laiho, R (2004) Conductivity and distribution of charge on electroluminescent Si/SiO2 structures investigated by electrostatic force microscopy. Applied Surface Science, 222. 131-137 doi:10.1016/j.apsusc.2003.08.004
In(n.d.) Applied Surface Science Vol. 222. Elsevier BV

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Heikkilä, L, Kuusela, T, Hedman, H.-P, Ihantola, H (1998) Electroluminescent SiO2/Si superlattices prepared by low pressure chemical vapour deposition. Applied Surface Science, 133. 84-88 doi:10.1016/s0169-4332(98)00186-x
Heikkilä, L., Kuusela, T., Hedman, H.-P. (2001) Electroluminescence in Si/SiO2 layer structures. Journal of Applied Physics, 89 (4). 2179-2184 doi:10.1063/1.1338986
Suominen, T, Huhtinen, H, Majumdar, S, Paturi, P, Zakhvalinskii, V S, Laiho, R (2009) Persistent photoinduced magnetization and oxygen non-stoichiometry in La0.9Ca0.1MnO3films. Journal of Physics: Condensed Matter, 21 (26). 266001pp. doi:10.1088/0953-8984/21/26/266001
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Laiho, R., Aarnio, M., Heikkilä, L., Snellman, H., Kirschner, I., Halász, I. (1988) Surface structures of YBa2Cu3O7-x, BiCa1·7Sr0·7Cu2Ox and TlCaBaCuO4·5±x investigated by scanning tunnelling microscopy. Journal of Microscopy, 152 (2). 407-413 doi:10.1111/j.1365-2818.1988.tb01402.x
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Angervo, I., Saloaro, M., Huhtinen, H., Paturi, P. (2017) Interface defects induced vertical magnetic anisotropy in Sr2FeMoO6 thin films. Applied Surface Science, 422. 682-689 doi:10.1016/j.apsusc.2017.05.171
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