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Huang, H.S., Cheng, H.M., Lin, L.J. (2005) Coating tips used in electrical scanning probe microscopy with W and AuPd. Applied Surface Science, 252. 2085-2091 doi:10.1016/j.apsusc.2005.03.208

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Reference TypeJournal (article/letter/editorial)
TitleCoating tips used in electrical scanning probe microscopy with W and AuPd
JournalApplied Surface Science
AuthorsHuang, H.S.Author
Cheng, H.M.Author
Lin, L.J.Author
Year2005 (December)Volume252
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2005.03.208Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9909085Long-form Identifiermindat:1:5:9909085:2
GUID0
Full ReferenceHuang, H.S., Cheng, H.M., Lin, L.J. (2005) Coating tips used in electrical scanning probe microscopy with W and AuPd. Applied Surface Science, 252. 2085-2091 doi:10.1016/j.apsusc.2005.03.208
Plain TextHuang, H.S., Cheng, H.M., Lin, L.J. (2005) Coating tips used in electrical scanning probe microscopy with W and AuPd. Applied Surface Science, 252. 2085-2091 doi:10.1016/j.apsusc.2005.03.208
In(n.d.) Applied Surface Science Vol. 252. Elsevier BV

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